An Introduction to Logic Circuit Testing - Brossura

Lala, Parag K.

Brossura

ISBN 10: 1598293508 ISBN 13: 9781598293500

Casa editrice: Morgan and Claypool Publishers, 2008

Riassunto

An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References

Dettagli dell'edizione

• Editore: Morgan and Claypool Publishers
• Data di pubblicazione: 2008
• Lingua: Inglese
• ISBN 10: 1598293508
• ISBN 13: 9781598293500
• Rilegatura: Copertina flessibile
• Numero di pagine: 110
• Contatto del produttore: non disponibile
• Persona responsabile: non disponibile