A Practical Guide to Transmission Electron Microscopy: Fundamentals - Brossura

Luo, Zhipling

 
9781606507032: A Practical Guide to Transmission Electron Microscopy: Fundamentals
Brossura
ISBN 10: 1606507036 ISBN 13: 9781606507032
Casa editrice: Momentum Pr, 2015

Sinossi

Transmission Electron Microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a Scanning Electron Microscope (SEM) at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron-specimen atom interactions. This book provides a concise practical guide to the TEM user, starting from the beginner level, including upper-division undergraduates, graduates, researchers, and engineers, on how to learn TEM efficiently in a short period of time. It covers most of the areas using TEM, including the instrumentation, sample preparation, diffraction, imaging, analytical microscopy, and some newly developed advanced microscopy techniques. This book may serve as a textbook for a TEM course or workshop, or a reference book for the TEM user to improve their TEM skills.

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Editore
Momentum Pr
Data di pubblicazione
2015
Lingua
Inglese
ISBN 10 
1606507036
ISBN 13 
9781606507032
Rilegatura
Copertina flessibile
Numero di pagine
152
Contatto del produttore
non disponibile
Persona responsabile
non disponibile