Articoli correlati a The Practice of Tof-sims: Time of Flight Secondary...

The Practice of Tof-sims: Time of Flight Secondary Ion Mass Spectrometry - Brossura

Spool, Alan M.

 
9781606507735: The Practice of Tof-sims: Time of Flight Secondary Ion Mass Spectrometry
Brossura
ISBN 10: 1606507737 ISBN 13: 9781606507735
Casa editrice: Momentum Pr, 2016

Sinossi

Time of flight secondary ion mass spectrometry, TOF-SIMS, is a highly surface sensitive analytical technique that provides information about composition with submicron lateral resolution. For select materials, TOF-SIMS provides unparalleled sensitivity along with excellent reproducibility, and as a mass spectrometric technique, it also provides excellent specificity. Of the analytical methods available, it is among the most surface sensitive, but the physical principles that underlie it are also the least understood. This volume describes the instrumentation, the physical principles behind the technique to the extent they are understood, and provides a practical approach for the interpretation of TOF-SIMS data. The use of advanced data processing methods such as multivariate statistics are described in a readily approachable manner. Given a basic background in undergraduate chemistry and physics, the book will be of use to any student with an interest in the technique.

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Editore
Momentum Pr
Data di pubblicazione
2016
Lingua
Inglese
ISBN 10 
1606507737
ISBN 13 
9781606507735
Rilegatura
Copertina flessibile
Numero di pagine
169
Contatto del produttore
non disponibile
Persona responsabile
gpsr@libri.de
gpsr@libri.de

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