Articoli correlati a ToF-SIMS : Surface Analysis by Mass Spectrometry
Sinossi
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. Current instrumentation provides a powerful combination of capabilities for molecular detection and trace element determination, imaging and microanalysis, and shallow depth profiling. This is the first book to be dedicated to the subject and the treatment is comprehensive. Following overview and historical chapters, there are sections devoted to: instrumentation and sample handling (three chapters); fundamentals and molecular dynamics simulations (four chapters); optimisation methods, including laser post-ionisation of sputtered neutrals (six chapters); data interpretation (two chapters), and analytical applications (eleven chapters). All the contributors are internationally recognised as leaders in their respective fields and come from both Europe and the USA.
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ToF-SIMS : Surface Analysis by Mass Spectrometry
Da: AwesomeBooks, Wallingford, Regno Unito
Valutazione del venditore 5 su 5 stelle
hardcover. Condizione: Very Good. ToF-SIMS : Surface Analysis by Mass Spectrometry This book is in very good condition and will be shipped within 24 hours of ordering. The cover may have some limited signs of wear but the pages are clean, intact and the spine remains undamaged. This book has clearly been well maintained and looked after thus far. Money back guarantee if you are not satisfied. See all our books here, order more than 1 book and get discounted shipping. Codice articolo 7719-9781901019032
Quantità: 1 disponibili
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ToF-SIMS : Surface Analysis by Mass Spectrometry
Da: Bahamut Media, Reading, Regno Unito
Valutazione del venditore 5 su 5 stelle
hardcover. Condizione: Very Good. This book is in very good condition and will be shipped within 24 hours of ordering. The cover may have some limited signs of wear but the pages are clean, intact and the spine remains undamaged. This book has clearly been well maintained and looked after thus far. Money back guarantee if you are not satisfied. See all our books here, order more than 1 book and get discounted shipping. Codice articolo 6545-9781901019032
Quantità: 1 disponibili
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ToF-SIMS: Surface Analysis by Mass Spectrometry
Da: Anybook.com, Lincoln, Regno Unito
Valutazione del venditore 5 su 5 stelle
Condizione: Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In fair condition, suitable as a study copy. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1800grams, ISBN:9781901019032. Codice articolo 4319102
Quantità: 1 disponibili