Strain and Dislocation Gradients from Diffraction: Spatially-Resolved Local Structure and Defects - Rilegato

 
9781908979629: Strain and Dislocation Gradients from Diffraction: Spatially-Resolved Local Structure and Defects

Sinossi

Scientists and engineers in the physical sciences describe diffraction studies of mesoscale strain gradients and dislocation distributions in crystals, which lie at the heart of emerging research programs around the world. While diffraction techniques to study materials at the nanoscale and macroscale are mature, the mesoscale (0.01-10) remains elusive both for experimental characterization and for theoretical modeling. The topics include X-ray Laue diffraction microscopy in three dimensions at the advanced proton source, three-dimensional X-ray diffraction microscopy, reconstructing two-dimensional and three-dimensional X-ray orientation maps from white-beam Laue, energy-variable X-ray diffraction, and high-pressure studies with micro-diffraction. Distributed in the US by World Scientific. Annotation ©2015 Ringgold, Inc., Portland, OR (protoview.com)

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Recensione

The scientific level of the book is excellent. I recommend this book to scientists interested in understanding the state of the art in characterizing local crystal structures and defects using X-ray micro-diffraction. --Journal of Applied Crystallography

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