Deep Learning for Advanced X-ray Detection and Imaging Applications - Rilegato

Rilegato

ISBN 10: 3031756525 ISBN 13: 9783031756528

Casa editrice: Springer-Verlag GmbH, 2025

Riassunto

This book provides a comprehensive overview of the latest advances in applying Artificial Intelligence (AI) to advanced X-ray imaging, with a particular focus on its medical applications.

Su questo libro

Informazioni sull?autore

Krzysztof (Kris) Iniewski is director of development architecture and applications at Redlen Technologies Inc. in British Columbia, Canada. During his 20 years at Redlen he has managed development of highly integrated CdZnTe detector products in medical imaging and security applications. Prior to Redlen Kris hold various management and academic positions at PMC-Sierra, University of Alberta, SFU, UBC and University of Toronto.

Dr. Iniewski has published over 150+ research papers in international journals and conferences. He holds 35+ international patents granted in USA, Canada, France, Germany, and Japan. He wrote and edited 75+ books for Wiley, Cambridge University Press, Mc-Graw Hill, CRC Press and Springer. He is a frequent invited speaker and has consulted for multiple organizations internationally.

Liang (Kevin) Cai is Manager of CT Reconstruction at Canon Medical Research USA. During his time at Canon, Dr. Cai managed several industry leading DeepLearning CT reconstruction algorithm development, including Advanced intelligent Clear-IQ Engine (AiCE), Precise IQ Engine (PIQE), and Deep Learning Spectral CT. Dr. Cai has extensive experience in X-ray and Gamma-ray imaging systems development, with broad expertise in both detection physics and reconstruction algorithms. Dr. Cai has published 50+ research papers in international journals and conferences. He is also a named inventor for 20+ granted US patents.

Dalla quarta di copertina

This book provides a comprehensive overview of the latest advances in applying Artificial Intelligence (AI) to advanced X-ray imaging, with a particular focus on its medical applications. Readers will discover why AI is set to revolutionize traditional signal processing and image reconstruction with vastly improved performance. The authors illustrate how Machine Learning (ML) and Deep Learning (DL) significantly advance X-ray detection analysis, image reconstruction, and other crucial steps. This book also reveals how these technologies enable photon counting detector-based X-ray Computed Tomography (CT), which has the potential not only to improve current CT images but also enable new clinical applications, such as providing higher spatial resolution, better soft tissue contrast, K-edge imaging, and simultaneous multi-contrast agent imaging.

• Explores the latest advances in applying Artificial Intelligence to advanced X-ray imaging;
• Provides reviews on innovative techniques for signal formation and image reconstruction process;
• Showcases the application of deep learning algorithms in Photon-Counting CT.

Dettagli dell'edizione

• Editore: Springer-Verlag GmbH
• Data di pubblicazione: 2025
• Lingua: Inglese
• ISBN 10: 3031756525
• ISBN 13: 9783031756528
• Rilegatura: Copertina rigida
• Numero di pagine: 272
• Redattore: Iniewski Krzysztof (Kris), Cai Liang (Kevin)
• Contatto del produttore: ProductSafety@springernature.com; ProductSafety@springernature.com; ; Poststr. 9; Darmstadt; 64293; Germania