Sinossi
Introduction.- From Metrology to Digital Data.- Uncertainty, Informaiton and Learning Mechanisms.- Randomized Algorithms.- Robustness Analysis.- Emotional Cognitive Mechanisms for Embedded Systems.- Performance Estimation and Probably Approximately Correct Computation.- Intelligent Mechanisms in Embedded Systems.- Learning in Nonstationary and Evolving Environments.- Fault Diagnosis Systems.
Le informazioni nella sezione "Riassunto" possono far riferimento a edizioni diverse di questo titolo.
