Life-Time Estimation of Modern Power Electronics Devices: Power cycling capability of advanced packaging and interconnection technologies at high temperature swings - Brossura

Amro, Raed

Brossura

ISBN 10: 3330852569 ISBN 13: 9783330852563

Casa editrice: Noor Publishing, 2017

Riassunto

Due to the increasing advancements in power devices, especially in Insulated Gate Bipolar Transistors (IGBT) technology, switching of kV and kA within μs is possible. Thereby a dissipation power up to 400W per chip is generated. Compared to the switched power, the dissipated power is still marginal. However, considering the area within this power is generated (< 2cm2), a significant heat density and thus high temperature especially within the chip is generated. To keep the maximal junction temperature (Tj,max) within the allowed range, reliable, thermally convenient packaging and interconnection concepts are necessary. Furthermore, power devices find increasingly application in automobile industry, where they have to fulfil high reliability requirements under harsh environmental conditions during their service lifetime of approx. 15 years.

Su questo libro

L'autore

Dr Raed Amro holds a doctoral degree in electrical engineering from the Technical University of Chemnitz in Germany.works as Professor at Palestine Polytechnic University in Hebron-Palestine.

Dettagli dell'edizione

• Editore: Noor Publishing
• Data di pubblicazione: 2017
• Lingua: Inglese
• ISBN 10: 3330852569
• ISBN 13: 9783330852563
• Rilegatura: Copertina flessibile
• Numero di pagine: 136
• Contatto del produttore: non disponibile
• Persona responsabile: non disponibile