Handbook of Microscopy: Methods II: 2 - Brossura

Brossura

ISBN 10: 3527294732 ISBN 13: 9783527294732

Casa editrice: Vch Verlagsgesellschaft Mbh, 1996

Riassunto

Comprehensive in coverage, written and edited by leading experts in the field, this Handbook is a definitive, up-to-date reference work. The Volumes Methods I and Methods II detail the physico-chemical basis and capabilities of the various microscopy techniques used in materials science. The Volume Applications illustrates the results obtained by all available methods for the main classes of materials, showing which technique can be successfully applied to a given material in order to obtain the desired information.

With the Handbook of Microscopy, scientists and engineers involved in materials characterization will be in a position to answer two key questions: "How does a given technique work?", and "Which techique is suitable for characterizing a given material?"

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Handbook of Microscopy Applications in Materials Science, Solid-State Physics and Chemistry Edited by S. Amelinckx, D. van Dyck, J. van Landuyt, G. van Tendeloo Comprehensive in coverage, written and edited by leading experts in the field, this Handbook is a definitive, up-to-date reference work. The Volumes Methods I and Methods II detail the physico-chemical basis and capabilities of the various microscopy techniques used in materials science. The Volume Applications illustrates the results obtained by all available methods for the main classes of materials, showing which technique can be successfully applied to a given material in order to obtain the desired information. With the Handbook of Microscopy, scientists and engineers involved in materials characterization will be in a position to answer two key questions: "How does a given technique work?", and "Which technique is suitable for characterizing a given material?" From the Contents: Electron Microscopy: Scanning Beam Methods, Magnetic Methods: NMR-Microscopy, Scanning Electron Microscopy with Polarization Analysis (SEMPA). Emission Methods: Photoemission Electron Microscopy, Field Emission Microscopy (FEM), Field Ion Microscopy. Scanning Point Probe Techniques: Scanning Tunnelling Microscopy STM, Atomic Force Microscopy AFM, Magnetic Force Microscopy MFM, Ballistic Electron Emission Microscopy (BEEM), Methods Under Development. Image Recording, Handling and Processing: Electronic Image Recording. Image Processing Special Topics: Coincidence Microscopy, Low Energy Holography.

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Dettagli dell?edizione

• Editore: Vch Verlagsgesellschaft Mbh
• Data di pubblicazione: 1996
• ISBN 10: 3527294732
• ISBN 13: 9783527294732
• Rilegatura: Copertina flessibile
• Lingua: Inglese
• Numero di pagine: 507
• Redattore: Amelinckx S.