Electron Microscopy: Principles and Fundamentals - Rilegato

Van Dyck, D.; Van Landuyt, J.; Van Tendeloo, G.

Rilegato

ISBN 10: 3527294791 ISBN 13: 9783527294794

Casa editrice: Vch Verlagsgesellschaft Mbh, 1997

Riassunto

Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research.<br> <br> Topics include:<br> * Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods<br> * Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry<br> * Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy<br> <br> Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.

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Dalla quarta di copertina

Electron Microscopy Principles and Fundamentals Edited by S. Amelinckx, D. van Dyck, J. van Landuyt, G. van Tendeloo Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include:

• Stationary Beam Methods: Transmission Electron Microscoy/Electron Energy Loss Spectroscopy/Convergent Electron Beam Diffraction/Low Energy Electron Microscopy/Electron Holographic Methods
• Scanning Beam Methods: Scanning Transmission Electron Microscopy/Scanning Auger and XPS Microscopy/Scanning Microanalysis/Imaging Secondary Ion Mass Spectrometry
• Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/Spin Polarized Low Energy Electron Microscopy

Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.

Dettagli dell?edizione

• Editore: Vch Verlagsgesellschaft Mbh
• Data di pubblicazione: 1997
• ISBN 10: 3527294791
• ISBN 13: 9783527294794
• Rilegatura: Copertina rigida
• Lingua: Inglese
• Numero di pagine: 527
• Redattore: Amelinckx S.
• Contatto del produttore: non disponibile