Three-Dimensional X-Ray Diffraction Microscopy: Mapping Polycrystals And Their Dynamics: 205 - Rilegato

Libro 103 di 227: Springer Tracts in Modern Physics

Poulsen, Henning F.

 
9783540223306: Three-Dimensional X-Ray Diffraction Microscopy: Mapping Polycrystals And Their Dynamics: 205

Sinossi

Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be determined simultaneously. Furthermore, the dynamics of the individual structural elements can be monitored during typical processes such as deformation or annealing.

The book gives a comprehensive account of the methodology followed by a summary of selected applications. The method is presented from a mathematical/crystallographic point-of-view but with sufficient hands-on details to enable the reader to plan his or her own experiments. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.

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Recensione

From the reviews:

"The aim of this book is to give a comprehensive account of 3DXRD microscopy, with a focus both on methodology and on applications. ... the book may serve to stimulate research in other fields also, such as geophysics, geology, chemistry, and pharmaceutical science. In short, the book is a very sound and gainful enterprise with good focus ... which is a welcome feature. Scientists working in the field will have cause to be elated at the prospect of acquiring and referring to the volume." (Current Engineering Practice, Vol. 47 (3), 2004-2005)

Contenuti

Introduction.- Methods for Meso-scale Structural Characterization.- Geometric Principles.- GRAINDEX and Related Analysis.- Orientation Mapping.- Combining 3DXRD and Absorption Contrast Tomography.- Multi-grain Crystallography.- The 3DXRD Microscope.- Applications.- Alternative Approaches.- Concluding Remarks.

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Altre edizioni note dello stesso titolo

9783662145432: Three-Dimensional X-Ray Diffraction Microscopy: Mapping Polycrystals and their Dynamics: 205

Edizione in evidenza

ISBN 10:  366214543X ISBN 13:  9783662145432
Casa editrice: Springer, 2013
Brossura