Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques - Rilegato

Rilegato

ISBN 10: 3540262423 ISBN 13: 9783540262428

Casa editrice: Springer Nature, 2006

Riassunto

The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.

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Recensione

From the reviews:

"The editors have done a good job in making the various chapters quite readable and most of the chapters are well written on a level that will be accessible to most readers. ... As is usually the case with Springer books, these volumes have been beautifully printed, illustrated, and nicely bound for long term durability." (Gary J. Long & Fernande Grandjean, Physicalia Magazine, Vol. 29 (4), 2007)

Contenuti

Robert W. Stark and Martin Stark: Higher Harmonics in Dynamic Atomic Force Microscopy.- Ute Rabe: Atomic Force Acoustic Microscopy.- Tilman E. Schäffer, Boris Anczykowski, Harald Fuchs: Scanning Ion Conductance Microscopy.- Wulf Wulfhekel, Uta Schlickum, Jürgen Kirschner: Spin-polarized Scanning Tunneling Microscopy.- Ferry Kienberger, Hermann Gruber, and Peter Hinterdorfer: Dynamic Force Microscopy and Spectroscopy.- Egbert Oesterschulze, Leon Abelmann, Arnout van den Bos, Rainer Kassing, Nicole Schwendler, Gunther Wittstock, and Christiane Ziegler: Sensor Technology for SPM and new Applications.- Malgorzata Lekka and Andrzej J. Kulik: Quantitative Nanomechanical Measurements in Biology.- Pascal Vairac and Bernard Cretin: Scanning Microdeformation Microscopy : Subsurface Imaging and Measurement of Elastic Constants at Mesoscopic Scale.- P. Girard and A.N. Titkov: Electrostatic Force and Force Gradient Microscopy: Principles, Points of Interests and Applications for Characterisations of Semiconductor Materials and Devices.- Pietro Giuseppe Gucciardi, Ruggero Micheletto, Yoichi Kawakami, and Maria Allegrini: Polarization-Modulation Techniques in Near-Field Optical Microscopy for Imaging of Polarization Anisotropy in Photonic Nanostructures.- Vittoria Raffa, Piero Castrataro, Arianna Menciassi, and Paolo Dario: Focused Ion Beam as a Scanning Probe: Methods and Applications.

Dettagli dell?edizione

• Editore: Springer Nature
• Data di pubblicazione: 2006
• Lingua: Inglese
• ISBN 10: 3540262423
• ISBN 13: 9783540262428
• Rilegatura: Copertina rigida
• Numero di pagine: 420
• Redattore: Bhushan Bharat, Fuchs Harald
• Contatto del produttore: non disponibile
• Persona responsabile: CMN Printpool Inh. Mathis Neumann; https://www.also.com/ec/cms5/en_6000/6000/index.jsp; ; Friedrich-Karl-Str. 9; Hamburg; Germania