This book constitutes the refereed proceedings of the 16th Iberoamerican Congress on Pattern Recognition, CIARP 2011, held in Pucón, Chile, in November 2011. The 81 revised full papers presented together with 3 keynotes were carefully reviewed and selected from numerous submissions. Topics of interest covered are image processing, restoration and segmentation; computer vision; clustering and artificial intelligence; pattern recognition and classification; applications of pattern recognition; and Chilean Workshop on Pattern Recognition.
Le informazioni nella sezione "Riassunto" possono far riferimento a edizioni diverse di questo titolo.
This book constitutes the refereed proceedings of the 16th Iberoamerican Congress on Pattern Recognition, CIARP 2011, held in Pucón, Chile, in November 2011. The 81 revised full papers presented together with 3 keynotes were carefully reviewed and selected from numerous submissions. Topics of interest covered are image processing, restoration and segmentation; computer vision; clustering and artificial intelligence; pattern recognition and classification; applications of pattern recognition; and Chilean Workshop on Pattern Recognition.
Le informazioni nella sezione "Su questo libro" possono far riferimento a edizioni diverse di questo titolo.
EUR 6,90 per la spedizione da Germania a Italia
Destinazione, tempi e costiEUR 9,70 per la spedizione da Germania a Italia
Destinazione, tempi e costiDa: Buchpark, Trebbin, Germania
Condizione: Gut. Zustand: Gut | Seiten: 721 | Sprache: Englisch | Produktart: Sonstiges. Codice articolo 11616322/13
Quantità: 1 disponibili
Da: moluna, Greven, Germania
Condizione: New. Codice articolo 5053781
Quantità: Più di 20 disponibili
Da: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlanda
Condizione: New. Editor(s): San Martin, Cesar; Kim, Sang-Woon. Series: Lecture Notes in Computer Science / Image Processing, Computer Vision, Pattern Recognition, and Graphics. Num Pages: 721 pages, 127 black & white illustrations, 146 colour illustrations, biography. BIC Classification: UMB; UNH; UYQP; UYT. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 41. Weight in Grams: 1066. . 2011. 2011. Paperback. . . . . Codice articolo V9783642250842
Quantità: 3 disponibili
Da: GreatBookPrices, Columbia, MD, U.S.A.
Condizione: New. Codice articolo 15616979-n
Quantità: 3 disponibili
Da: GreatBookPrices, Columbia, MD, U.S.A.
Condizione: As New. Unread book in perfect condition. Codice articolo 15616979
Quantità: 3 disponibili
Da: Kennys Bookstore, Olney, MD, U.S.A.
Condizione: New. Editor(s): San Martin, Cesar; Kim, Sang-Woon. Series: Lecture Notes in Computer Science / Image Processing, Computer Vision, Pattern Recognition, and Graphics. Num Pages: 721 pages, 127 black & white illustrations, 146 colour illustrations, biography. BIC Classification: UMB; UNH; UYQP; UYT. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 41. Weight in Grams: 1066. . 2011. 2011. Paperback. . . . . Books ship from the US and Ireland. Codice articolo V9783642250842
Quantità: 3 disponibili
Da: Revaluation Books, Exeter, Regno Unito
Paperback. Condizione: Brand New. 2011 edition. 721 pages. 9.00x6.00x1.50 inches. In Stock. Codice articolo x-364225084X
Quantità: 2 disponibili
Da: Lucky's Textbooks, Dallas, TX, U.S.A.
Condizione: New. Codice articolo ABLING22Oct2817100464437
Quantità: 1 disponibili
Da: Grand Eagle Retail, Fairfield, OH, U.S.A.
Paperback. Condizione: new. Paperback. This book constitutes the refereed proceedings of the 16th Iberoamerican Congress on Pattern Recognition, CIARP 2011, held in Pucon, Chile, in November 2011. The 81 revised full papers presented together with 3 keynotes were carefully reviewed and selected from numerous submissions. Topics of interest covered are image processing, restoration and segmentation; computer vision; clustering and artificial intelligence; pattern recognition and classification; applications of pattern recognition; and Chilean Workshop on Pattern Recognition. This book constitutes the refereed proceedings of the 16th Iberoamerican Congress on Pattern Recognition, CIARP 2011, held in Pucon, Chile, in November 2011. pattern recognition and classification; applications of pattern recognition; and Chilean Workshop on Pattern Recognition. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Codice articolo 9783642250842
Quantità: 1 disponibili