Sinossi
The analysis of static crack and its growth is important issue as to ensure reliability and to avoid catastrophic consequences which leads to the loss of life in case of many industrial applications since most of the failures start from the crack. In this work, XFEM has been used to simulate the fatigue crack growth problems in FGM in the presence of hole, inclusion and minor crack under plastic and plane stress conditions. XFEM technique allows mesh independent crack modelling, and avoids remeshing while crack growth. To model a crack in XFEM, standard FE approximation is enriched with some functions, which are obtained from the theoretical background of the problem. The level set method is used to track a moving discontinuity. The validity of LEFM theory is limited to the brittle materials. Therefore, the EPFM theory needs to be utilized to characterize the plastic behaviour of the material. A generalized Ramberg-Osgood material model has been used to model the stress-strain behaviour of the material. Plasticity has been checked by Von Mises Yield criteria. J- integral has been used to calculate the SIF. Crack growth direction is determined by maximum principal stress criteria.
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L'autore
Dr Kamal Sharma, BE (Mechanical), M Tech, Phd, Scientific Officer in Bhabha Atomic Research Centre, India. Field of Interest is fracture Mechanics, XFEM, EFGM, XIGA, Residual stress, Miniature Specimen Testing, ANN etc.
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Simulation of EPFM Problems in Functionally Graded Material with XFEM
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LAP Lambert Academic Publishing Aug 2016, 2016
ISBN 10: 3659922854
ISBN 13: 9783659922855
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Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The analysis of static crack and its growth is important issue as to ensure reliability and to avoid catastrophic consequences which leads to the loss of life in case of many industrial applications since most of the failures start from the crack. In this work, XFEM has been used to simulate the fatigue crack growth problems in FGM in the presence of hole, inclusion and minor crack under plastic and plane stress conditions. XFEM technique allows mesh independent crack modelling, and avoids remeshing while crack growth. To model a crack in XFEM, standard FE approximation is enriched with some functions, which are obtained from the theoretical background of the problem. The level set method is used to track a moving discontinuity. The validity of LEFM theory is limited to the brittle materials. Therefore, the EPFM theory needs to be utilized to characterize the plastic behaviour of the material. A generalized Ramberg-Osgood material model has been used to model the stress-strain behaviour of the material. Plasticity has been checked by Von Mises Yield criteria. J- integral has been used to calculate the SIF. Crack growth direction is determined by maximum principal stress criteria. 84 pp. Englisch. Codice articolo 9783659922855
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Simulation of EPFM Problems in Functionally Graded Material with XFEM
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ISBN 10: 3659922854
ISBN 13: 9783659922855
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Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Sharma KamalDr Kamal Sharma, BE (Mechanical), M Tech, Phd, Scientific Officer in Bhabha Atomic Research Centre, India. Field of Interest is fracture Mechanics, XFEM, EFGM, XIGA, Residual stress, Miniature Specimen Testing, ANN etc. Codice articolo 158125332
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Simulation of EPFM Problems in Functionally Graded Material with XFEM
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LAP Lambert Academic Publishing Aug 2016, 2016
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ISBN 13: 9783659922855
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Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The analysis of static crack and its growth is important issue as to ensure reliability and to avoid catastrophic consequences which leads to the loss of life in case of many industrial applications since most of the failures start from the crack. In this work, XFEM has been used to simulate the fatigue crack growth problems in FGM in the presence of hole, inclusion and minor crack under plastic and plane stress conditions. XFEM technique allows mesh independent crack modelling, and avoids remeshing while crack growth. To model a crack in XFEM, standard FE approximation is enriched with some functions, which are obtained from the theoretical background of the problem. The level set method is used to track a moving discontinuity. The validity of LEFM theory is limited to the brittle materials. Therefore, the EPFM theory needs to be utilized to characterize the plastic behaviour of the material. A generalized Ramberg-Osgood material model has been used to model the stress-strain behaviour of the material. Plasticity has been checked by Von Mises Yield criteria. J- integral has been used to calculate the SIF. Crack growth direction is determined by maximum principal stress criteria.Books on Demand GmbH, Überseering 33, 22297 Hamburg 84 pp. Englisch. Codice articolo 9783659922855
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Simulation of EPFM Problems in Functionally Graded Material with XFEM
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LAP Lambert Academic Publishing, 2016
ISBN 10: 3659922854
ISBN 13: 9783659922855
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Taschenbuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - The analysis of static crack and its growth is important issue as to ensure reliability and to avoid catastrophic consequences which leads to the loss of life in case of many industrial applications since most of the failures start from the crack. In this work, XFEM has been used to simulate the fatigue crack growth problems in FGM in the presence of hole, inclusion and minor crack under plastic and plane stress conditions. XFEM technique allows mesh independent crack modelling, and avoids remeshing while crack growth. To model a crack in XFEM, standard FE approximation is enriched with some functions, which are obtained from the theoretical background of the problem. The level set method is used to track a moving discontinuity. The validity of LEFM theory is limited to the brittle materials. Therefore, the EPFM theory needs to be utilized to characterize the plastic behaviour of the material. A generalized Ramberg-Osgood material model has been used to model the stress-strain behaviour of the material. Plasticity has been checked by Von Mises Yield criteria. J- integral has been used to calculate the SIF. Crack growth direction is determined by maximum principal stress criteria. Codice articolo 9783659922855
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Simulation of EPFM Problems in Functionally Graded Material with XFEM
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Taschenbuch. Condizione: Neu. Simulation of EPFM Problems in Functionally Graded Material with XFEM | Kamal Sharma (u. a.) | Taschenbuch | 84 S. | Englisch | 2016 | LAP LAMBERT Academic Publishing | EAN 9783659922855 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu. Codice articolo 103430744
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