Articoli correlati a Surface Roughness Study by Atomic Force Microscopy:...

Surface Roughness Study by Atomic Force Microscopy: Surface Roughness-Practical Example - Brossura

Sayeed, Md.Abu; Ferdous, Zakia

 
9783848400355: Surface Roughness Study by Atomic Force Microscopy: Surface Roughness-Practical Example
Brossura
ISBN 10: 3848400359 ISBN 13: 9783848400355
Casa editrice: LAP LAMBERT Academic Publishing, 2012

Sinossi

AFM is becoming a key technique in many fields of nano-science and nano-technology. The AFM is capable of measuring nanometer scale images of insulating surfaces with thickness as well as measuring three dimensional images of surfaces and studying the topography. It is very suitable for biological system to determine substrate roughness analysis. The chitinous materials that mean microbiological matter are imaged for determining the surface roughness and interaction force of microbial surfaces by AFM.

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L'autore

Md.Abu Sayeed has completed his Bachelor of science in Electrical & Electronic Engineering from Khulna University of Engineering & Technology,Bangladesh.

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Editore
LAP LAMBERT Academic Publishing
Data di pubblicazione
2012
Lingua
Inglese
ISBN 10 
3848400359
ISBN 13 
9783848400355
Rilegatura
Copertina flessibile
Numero di pagine
72
Contatto del produttore
non disponibile
Persona responsabile
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