Gettering And Defect Engineering In Semiconductor Technology XII: Gadest 2007 : Proceedings of the 12th International Autumn Meeting Emfcsc, Erice, Italy October 14-19, 2007 - Brossura

Brossura

ISBN 10: 3908451434 ISBN 13: 9783908451433

Casa editrice: Trans Tech Pubn, 2008

Riassunto

Volume is indexed by Thomson Reuters CPCI-S (WoS).
This collection comprises 117 peerreviewed papers invited from over 70 research institutions in more than 25 countries. These papers, written by internationally recognized experts in the field, review the current state-of-the-art and predict future trends in their respective authors’ fields of research. Fundamental aspects, as well as technological problems associated with defects in electronic materials and devices, are addressed

Dettagli dell'edizione

• Editore: Trans Tech Pubn
• Data di pubblicazione: 2008
• Lingua: Inglese
• ISBN 10: 3908451434
• ISBN 13: 9783908451433
• Rilegatura: Copertina flessibile
• Numero di pagine: 642
• Redattore: Cavallini A., Richter H., Kittler M., Pizzini S.
• Contatto del produttore: non disponibile
• Persona responsabile: non disponibile