Gettering And Defect Engineering In Semiconductor Technology XII: Gadest 2007 : Proceedings of the 12th International Autumn Meeting Emfcsc, Erice, Italy October 14-19, 2007 - Brossura

 
9783908451433: Gettering And Defect Engineering In Semiconductor Technology XII: Gadest 2007 : Proceedings of the 12th International Autumn Meeting Emfcsc, Erice, Italy October 14-19, 2007
Brossura
ISBN 10: 3908451434 ISBN 13: 9783908451433
Casa editrice: Trans Tech Pubn, 2008

Sinossi

Volume is indexed by Thomson Reuters CPCI-S (WoS).
This collection comprises 117 peerreviewed papers invited from over 70 research institutions in more than 25 countries. These papers, written by internationally recognized experts in the field, review the current state-of-the-art and predict future trends in their respective authors’ fields of research. Fundamental aspects, as well as technological problems associated with defects in electronic materials and devices, are addressed

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Editore
Trans Tech Pubn
Data di pubblicazione
2008
Lingua
Inglese
ISBN 10 
3908451434
ISBN 13 
9783908451433
Rilegatura
Copertina flessibile
Numero di pagine
642
Redattore
Cavallini A., Richter H., Kittler M., Pizzini S.
Contatto del produttore
non disponibile
Persona responsabile
non disponibile