Articoli correlati a Software-Based Self-Test with Decision Diagrams for...
- EditoreLAP LAMBERT Academic Publishing
- Data di pubblicazione2018
- ISBN 10 6137339475
- ISBN 13 9786137339473
- RilegaturaCopertina flessibile
- LinguaInglese
- Numero di pagine180
Compra nuovo
Visualizza questo articolo
EUR 64,90
EUR 23,00 per la spedizione da Germania a U.S.A.
Destinazione, tempi e costiRisultati della ricerca per Software-Based Self-Test with Decision Diagrams for...
Immagini fornite dal venditore
Software-Based Self-Test with Decision Diagrams for Microprocessors
Editore:
LAP LAMBERT Academic Publishing Feb 2018, 2018
ISBN 10: 6137339475
ISBN 13: 9786137339473
Nuovo
Taschenbuch
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
Valutazione del venditore 5 su 5 stelle
Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The field of Software-Based Self-Test (SBST) has been a topic of extensive research in industry and academia for more than three decades. Despite that an automated self-test generation is still lacking a suitable formalisation for modeling of microprocessors. This book presents a methodology to formalize and automate SBST synthesis and is leading to a reassessment of microprocessor modeling process. The book consists of four logically connected parts, starting with state-of-the-art in the field of SBST and with introductory material on modelling methods. The following parts narrate the problems of microprocessor model synthesis, high-level fault modeling, test data generation, and self-test test program construction. Based on the ground set in the first two parts, the book presents methods of automation of model synthesis and self-test program synthesis. Final part completes the research, incorporating the SBST programs into testing flow of processor-centric boards. The book is intended for use by CAD and test engineers, researchers, graduate students, or as supplementary material for courses on computer architectures, and test or design for testability of digital systems. 180 pp. Englisch. Codice articolo 9786137339473
Quantità: 2 disponibili
Immagini fornite dal venditore
Software-Based Self-Test with Decision Diagrams for Microprocessors
Editore:
LAP LAMBERT Academic Publishing, 2018
ISBN 10: 6137339475
ISBN 13: 9786137339473
Nuovo
Taschenbuch
Da: AHA-BUCH GmbH, Einbeck, Germania
Valutazione del venditore 5 su 5 stelle
Taschenbuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - The field of Software-Based Self-Test (SBST) has been a topic of extensive research in industry and academia for more than three decades. Despite that an automated self-test generation is still lacking a suitable formalisation for modeling of microprocessors. This book presents a methodology to formalize and automate SBST synthesis and is leading to a reassessment of microprocessor modeling process. The book consists of four logically connected parts, starting with state-of-the-art in the field of SBST and with introductory material on modelling methods. The following parts narrate the problems of microprocessor model synthesis, high-level fault modeling, test data generation, and self-test test program construction. Based on the ground set in the first two parts, the book presents methods of automation of model synthesis and self-test program synthesis. Final part completes the research, incorporating the SBST programs into testing flow of processor-centric boards. The book is intended for use by CAD and test engineers, researchers, graduate students, or as supplementary material for courses on computer architectures, and test or design for testability of digital systems. Codice articolo 9786137339473
Quantità: 1 disponibili
Immagini fornite dal venditore
Software-Based Self-Test with Decision Diagrams for Microprocessors
Editore:
LAP LAMBERT Academic Publishing, 2018
ISBN 10: 6137339475
ISBN 13: 9786137339473
Nuovo
Brossura
Da: moluna, Greven, Germania
Valutazione del venditore 5 su 5 stelle
Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Ubar RaimundRaimund Ubar, PhD: professor at Tallinn University of Technology, Estonia. Fields of Study: computer science, design for testability, fault diagnosis in digital systems. Lectured in 20+ universities, participated in 10+ E. Codice articolo 508183825
Quantità: Più di 20 disponibili