Preparation and characterization of low-k material for microelectronics:: Possible development of mechanical characterization at submicrometric scales with laser ultrasonics technique - Brossura
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On the morning of my professional career, as research and development engineer, I had the chance to work at the Institute of Micro Electronic Center (IMEC). This book presents the work I have done from February till September 2007 and its focuses on the investigation of mechanical properties of low-k materials using opto-acoustic technique. Before approaching the opto-acoustic method itself, I practiced the techniques of thin films deposition, plasma treatment and spectro-ellipsometric characterization of materials. Unlike spectro-ellipsometric thin films study, the opto-acoustic characterization requires working with samples which include a transducer material. So, at first, we have designed some samples geometries to be analyzed. The goal of this comparative study (mechanic and acoustic) is not only to establish a correlation between nanoindentation and acoustic wave techniques, but also to determine the factors which best describe mechanical properties of low-k materials. The work has been done in collaboration with the Laboratory of Condensed Matter Physics (LPEC), located in Le Mans (France).
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Preparation and characterization of low-k material for microelectronics:: Possible development of mechanical characterization at submicrometric scales with laser ultrasonics technique
Editore:
LAP LAMBERT Academic Publishing, 2021
ISBN 10: 6204208489
ISBN 13: 9786204208480
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Preparation and characterization of low-k material for microelectronics:
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LAP LAMBERT Academic Publishing Okt 2021, 2021
ISBN 10: 6204208489
ISBN 13: 9786204208480
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Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -On the morning of my professional career, as research and development engineer, I had the chance to work at the Institute of Micro Electronic Center (IMEC). This book presents the work I have done from February till September 2007 and its focuses on the investigation of mechanical properties of low-k materials using opto-acoustic technique. Before approaching the opto-acoustic method itself, I practiced the techniques of thin films deposition, plasma treatment and spectro-ellipsometric characterization of materials. Unlike spectro-ellipsometric thin films study, the opto-acoustic characterization requires working with samples which include a transducer material. So, at first, we have designed some samples geometries to be analyzed. The goal of this comparative study (mechanic and acoustic) is not only to establish a correlation between nanoindentation and acoustic wave techniques, but also to determine the factors which best describe mechanical properties of low-k materials. The work has been done in collaboration with the Laboratory of Condensed Matter Physics (LPEC), located in Le Mans (France). 84 pp. Englisch. Codice articolo 9786204208480
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Preparation and characterization of low-k material for microelectronics:: Possible development of mechanical characterization at submicrometric scales with laser ultrasonics technique
Editore:
LAP LAMBERT Academic Publishing, 2021
ISBN 10: 6204208489
ISBN 13: 9786204208480
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Preparation and characterization of low-k material for microelectronics:: Possible development of mechanical characterization at submicrometric scales with laser ultrasonics technique
Editore:
LAP LAMBERT Academic Publishing, 2021
ISBN 10: 6204208489
ISBN 13: 9786204208480
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Preparation and characterization of low-k material for microelectronics:
Editore:
LAP LAMBERT Academic Publishing Okt 2021, 2021
ISBN 10: 6204208489
ISBN 13: 9786204208480
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Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
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Taschenbuch. Condizione: Neu. Neuware -On the morning of my professional career, as research and development engineer, I had the chance to work at the Institute of Micro Electronic Center (IMEC). This book presents the work I have done from February till September 2007 and its focuses on the investigation of mechanical properties of low-k materials using opto-acoustic technique. Before approaching the opto-acoustic method itself, I practiced the techniques of thin films deposition, plasma treatment and spectro-ellipsometric characterization of materials. Unlike spectro-ellipsometric thin films study, the opto-acoustic characterization requires working with samples which include a transducer material. So, at first, we have designed some samples geometries to be analyzed. The goal of this comparative study (mechanic and acoustic) is not only to establish a correlation between nanoindentation and acoustic wave techniques, but also to determine the factors which best describe mechanical properties of low-k materials. The work has been done in collaboration with the Laboratory of Condensed Matter Physics (LPEC), located in Le Mans (France).Books on Demand GmbH, Überseering 33, 22297 Hamburg 84 pp. Englisch. Codice articolo 9786204208480
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Preparation and characterization of low-k material for microelectronics: : Possible development of mechanical characterization at submicrometric scales with laser ultrasonics technique
Editore:
LAP LAMBERT Academic Publishing, 2021
ISBN 10: 6204208489
ISBN 13: 9786204208480
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Taschenbuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - On the morning of my professional career, as research and development engineer, I had the chance to work at the Institute of Micro Electronic Center (IMEC). This book presents the work I have done from February till September 2007 and its focuses on the investigation of mechanical properties of low-k materials using opto-acoustic technique. Before approaching the opto-acoustic method itself, I practiced the techniques of thin films deposition, plasma treatment and spectro-ellipsometric characterization of materials. Unlike spectro-ellipsometric thin films study, the opto-acoustic characterization requires working with samples which include a transducer material. So, at first, we have designed some samples geometries to be analyzed. The goal of this comparative study (mechanic and acoustic) is not only to establish a correlation between nanoindentation and acoustic wave techniques, but also to determine the factors which best describe mechanical properties of low-k materials. The work has been done in collaboration with the Laboratory of Condensed Matter Physics (LPEC), located in Le Mans (France). Codice articolo 9786204208480
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Preparation and characterization of low-k material for microelectronics: | Possible development of mechanical characterization at submicrometric scales with laser ultrasonics technique
Editore:
LAP LAMBERT Academic Publishing, 2021
ISBN 10: 6204208489
ISBN 13: 9786204208480
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Taschenbuch. Condizione: Neu. Preparation and characterization of low-k material for microelectronics: | Possible development of mechanical characterization at submicrometric scales with laser ultrasonics technique | Merlin Nsenkoue | Taschenbuch | Englisch | 2021 | LAP LAMBERT Academic Publishing | EAN 9786204208480 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu. Codice articolo 120723116
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