EUR 15,36 per la spedizione da Cina a U.S.A.
Destinazione, tempi e costiDa: liu xing, Nanjing, JS, Cina
paperback. Condizione: New. Language:Chinese.Paperback. Pub Date: 2012-7-1 Pages: 109 Publisher: advantages of Harbin Engineering University Press emerging magnetic memory testing technique. known as one of the most promising non-destructive testing technology of the 21st century. with a predicted life expectancy of ferromagnetic workpieces . Magnetic memory signal processing and downhole applications from the magnetic memory testing instrument hardware design. signal multi-information processing. feature extraction and. Codice articolo BY075339
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