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Study on surface enhanced Raman scattering based on semiconductor TIO2(Chinese Edition)
Editore:
Heilongjiang University Press, 2017
ISBN 10: 7568600963
ISBN 13: 9787568600965
Nuovo
paperback
Da: liu xing, Nanjing, JS, Cina
Valutazione del venditore 5 su 5 stelle
paperback. Condizione: New. Language:Chinese.Paperback. Pub Date: 2017-05-01 Publisher: Heilongjiang University Press Co. Ltd. for axially compressed rod. if the end is connected by a hinged connection. the bending moment of the pressure is presented with the intermediate bending moment * Large degree. And then to the ends of the rods. This book introduces several surface-enhanced Raman scattering studies based on semiconductor TiO2. Total includes 6 chapters. according to the introduction. expensive . Codice articolo DP052909
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