[Defect-oriented Testing for Nano-metric CMOS VLSI Circuits] (By: Manoj Sachdev) [published: February, 2010] - Brossura

 
9788184894295: [Defect-oriented Testing for Nano-metric CMOS VLSI Circuits] (By: Manoj Sachdev) [published: February, 2010]

Altre edizioni note dello stesso titolo

9780387465463: Defect-Oriented Testing for Nano-Metric Cmos Vlsi Circuits: 34

Edizione in evidenza

ISBN 10:  0387465464 ISBN 13:  9780387465463
Casa editrice: Springer Verlag, 2007
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