Scanning Tunneling Microscopy and Related Methods: 184 - Brossura

Brossura

ISBN 10: 9048140757 ISBN 13: 9789048140756

Casa editrice: Springer, 2010

Riassunto

Proceedings of the NATO Advanced Study Institute on Basic Concepts and Applications of Scanning Tunneling Microscopy, Erice, Italy, April 17-29, 1989

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Contenuti

I. Methods.- 1) Scanning Tunneling Microscopy — methods and variations.- II. Theory.- 2) A brief introduction to tunneling theory.- 3) Tunneling times for one-dimensional barriers.- 4) Theory of Scanning Tunneling Microscopy and Spectroscopy.- 5) Theory of tunneling from transition metal tips.- 6) Tip-surface interactions.- 7) On the quantized conductance of small contacts.- 8) Adiabatic evolution and resonant tunneling through a one-dimensional constriction.- 9) What do we mean by ‘work function’.- III. Applications of STM at Solid State Surfaces.- 10) Scanning Tunneling Microscopy: Metal surfaces, adsorption and surface reactions.- 11) Scanning Tunneling Microscopy: Semiconductor surfaces, adsorption and epitaxy.- 12) Spectroscopy using conduction electrons.- 13) Scanning Tunneling Optical Microscopy (STOM) of silver nanostructures.- 14) Surface modification with the STM and the AFM.- IV. Liquid-Solid Interface.- 15) Scanning Probe Microscopy of liquid-solid interfaces.- 16) In-situ Scanning Tunneling Microscopy in electrochemistry.- V. Applications of STM at Organic and Biological Materials.- 17) Imaging and conductivity of biological and organic material.- 18) Study of the biocompatibility of surgical implant materials at the atomic and molecular level using Scanning Tunneling Microscopy.- 19) Naked DNA helicity observed by Scanning Tunneling Microscopy.- 20) Applications of Scanning Tunneling Microscopy to layered materials, organic charge transfer complexes and conductive polymers.- 21) Electron túnneling through a molecule.- 22) Electronic transport in disordered organic chains.- VI. Electron and Ion Point Sources.- 23) Electron and ion point sources, properties and applications.- 24) Field electron emission from atomic-size microtips.- VII. Force Microscopy.- 25) Force Microscopy.- 26) Electret-condensor-microphone used as a very sensitive force sensor.- VIII. Optical and Acoustic Microscopy.- 27) Resolution and contrast generation in Scanning Near-Field Optical Microscopy.- 28) Scanning Tunneling Optical Microscopy.- 29) Scanning Near-Field Acoustic Microscopy.

Dettagli dell'edizione

• Editore: Springer
• Data di pubblicazione: 2010
• Lingua: Inglese
• ISBN 10: 9048140757
• ISBN 13: 9789048140756
• Rilegatura: Copertina flessibile
• Numero di pagine: 536
• Redattore: Behm R.J., García N., Rohrer H.
• Contatto del produttore: Springer Nature Customer Service Center GmbH; ProductSafety@springernature.com; ; Europaplatz 3; Heidelberg; 69115; Germania