Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. This has recently generated a great demand for low-power, low-voltage A/D converters that can be realized in a mainstream deep-submicron CMOS technology. However, the discrepancies between lithography wavelengths and circuit feature sizes are increasing. Lower power supply voltages significantly reduce noise margins and increase variations in process, device and design parameters. Consequently, it is steadily more difficult to control the fabrication process precisely enough to maintain uniformity. The inherent randomness of materials used in fabrication at nanoscopic scales means that performance will be increasingly variable, not only from die-to-die but also within each individual die. Parametric variability will be compounded by degradation in nanoscale integrated circuits resulting in instability of parameters over time, eventually leading to the development of faults. Process variation cannot be solved by improving manufacturing tolerances; variability must be reduced by new device technology or managed by design in order for scaling to continue. Similarly, within-die performance variation also imposes new challenges for test methods.In an attempt to address these issues, Low-Power High-Resolution Analog-to-Digital Converters specifically focus on: i) improving the power efficiency for the high-speed, and low spurious spectral A/D conversion performance by exploring the potential of low-voltage analog design and calibration techniques, respectively, and ii) development of circuit techniques and algorithms to enhance testing and debugging potential to detect errors dynamically, to isolate and confine faults, and to recover errors continuously. The feasibility of the described methods has been verified by measurements from the silicon prototypes fabricated in standard 180nm, 90nm and 65nm CMOS technology. 316 pp. Englisch. Codice articolo 9789402405309

Contatta il venditore

Compra nuovo

EUR 53,49

Convertire valuta

Spese di spedizione: EUR 23,00

Da: Germania a: U.S.A.

Destinazione, tempi e costi

Quantit�: 2 disponibili

Aggiungi al carrello

Foto dell'editore

Low-Power High-Resolution Analog to Digital Converters: Design, Test and Calibration (Analog Circuits and Signal Processing)

Zjajo, Amir; Pineda De Gyvez, Jos�

Editore: Springer, 2016

ISBN 10: 9402405305 ISBN 13: 9789402405309

Nuovo Brossura

Da: Ria Christie Collections, Uxbridge, Regno Unito

Valutazione del venditore 5 su 5 stelle

Condizione: New. In. Codice articolo ria9789402405309_new

Contatta il venditore

Compra nuovo

EUR 62,24

Convertire valuta

Spese di spedizione: EUR 14,25

Da: Regno Unito a: U.S.A.

Destinazione, tempi e costi

Quantit�: Pi� di 20 disponibili

Aggiungi al carrello

Immagini fornite dal venditore

Low-power High-resolution Analog to Digital Converters : Design, Test and Calibration

Zjajo, Amir; De Gyvez, Jos� Pineda

Editore: Springer, 2016

ISBN 10: 9402405305 ISBN 13: 9789402405309

Nuovo Brossura

Da: GreatBookPricesUK, Woodford Green, Regno Unito

Valutazione del venditore 5 su 5 stelle

Condizione: New. Codice articolo 26594493-n

Contatta il venditore

Compra nuovo

EUR 62,23

Convertire valuta

Spese di spedizione: EUR 17,84

Da: Regno Unito a: U.S.A.

Destinazione, tempi e costi

Quantit�: Pi� di 20 disponibili

Aggiungi al carrello

Immagini fornite dal venditore

Low-Power High-Resolution Analog to Digital Converters : Design, Test and Calibration

Jos� Pineda de Gyvez

Editore: Springer Netherlands, Springer Netherlands, 2016

ISBN 10: 9402405305 ISBN 13: 9789402405309

Nuovo Taschenbuch

Da: AHA-BUCH GmbH, Einbeck, Germania

Valutazione del venditore 5 su 5 stelle

Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. This has recently generated a great demand for low-power, low-voltage A/D converters that can be realized in a mainstream deep-submicron CMOS technology. However, the discrepancies between lithography wavelengths and circuit feature sizes are increasing. Lower power supply voltages significantly reduce noise margins and increase variations in process, device and design parameters. Consequently, it is steadily more difficult to control the fabrication process precisely enough to maintain uniformity. The inherent randomness of materials used in fabrication at nanoscopic scales means that performance will be increasingly variable, not only from die-to-die but also within each individual die. Parametric variability will be compounded by degradation in nanoscale integrated circuits resulting in instability of parameters over time, eventually leading to the development of faults. Process variation cannot be solved by improving manufacturing tolerances; variability must be reduced by new device technology or managed by design in order for scaling to continue. Similarly, within-die performance variation also imposes new challenges for test methods.In an attempt to address these issues, Low-Power High-Resolution Analog-to-Digital Converters specifically focus on: i) improving the power efficiency for the high-speed, and low spurious spectral A/D conversion performance by exploring the potential of low-voltage analog design and calibration techniques, respectively, and ii) development of circuit techniques and algorithms to enhance testing and debugging potential to detect errors dynamically, to isolate and confine faults, and to recover errors continuously. The feasibility of the described methods has been verified by measurementsfrom the silicon prototypes fabricated in standard 180nm, 90nm and 65nm CMOS technology. Codice articolo 9789402405309

Contatta il venditore

Compra nuovo

EUR 58,56

Convertire valuta

Spese di spedizione: EUR 30,40

Da: Germania a: U.S.A.

Destinazione, tempi e costi

Quantit�: 1 disponibili

Aggiungi al carrello

Immagini fornite dal venditore

Low-Power High-Resolution Analog to Digital Converters

Amir Zjajo|Jos� Pineda de Gyvez

Editore: Springer Netherlands, 2016

ISBN 10: 9402405305 ISBN 13: 9789402405309

Nuovo Brossura

Print on Demand

Da: moluna, Greven, Germania

Valutazione del venditore 5 su 5 stelle

Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Unique combination of design, test, debugging and calibration of A/D converters (probably only on the market)Numerous examples and easy to follow procedure for design, test, debugging and calibration of A/D convertersBoth state-of-the art software and hardw. Codice articolo 449919556

Contatta il venditore