Articoli correlati a CMOS RF Circuit Design for Reliability and Variability

CMOS RF Circuit Design for Reliability and Variability - Brossura

Yuan, Jiann-Shiun

 
9789811008825: CMOS RF Circuit Design for Reliability and Variability
Brossura
ISBN 10: 9811008825 ISBN 13: 9789811008825
Casa editrice: Springer, 2016

Sinossi

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.

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Editore
Springer
Data di pubblicazione
2016
Lingua
Inglese
ISBN 10 
9811008825
ISBN 13 
9789811008825
Rilegatura
Copertina flessibile
Numero edizione
1
Numero di pagine
112
Contatto del produttore
GPSR Kontakt
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