Accuracy in Trace Analysis; Sampling, Sample Handling, Analysis, Vol. 1: Proceedings of the 7th Materials Research Symposium Held at the National Bureau of Standards, Gaithersburg, MD., October 7-11, 1974 (Classic Reprint)

Philip D. Lafleur

ISBN 10: 0331355388 / ISBN 13: 9780331355383

Editore: Forgotten Books, 2018

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Dati bibliografici

• Titolo: Accuracy in Trace Analysis; Sampling, Sample Handling, Analysis, Vol. 1: Proceedings of the 7th Materials Research Symposium Held at the National Bureau of Standards, Gaithersburg, MD., October 7-11, 1974 (Classic Reprint)
• Editore: Forgotten Books
• Data di pubblicazione: 2018
• Lingua: Inglese
• ISBN 10: 0331355388
• ISBN 13: 9780331355383
• Rilegatura: HRD
• Condizione: New
• Peso: 1156 grammi

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Riassunto

Excerpt from Accuracy in Trace Analysis; Sampling, Sample Handling, Analysis, Vol. 1: Proceedings of the 7th Materials Research Symposium Held at the National Bureau of Standards, Gaithersburg, MD., October 7-11, 1974

This volume, the formal report of the proceedings of the 7th Materials Research Symposium held at the National Bureau of Standards in Gaithersburg, Maryland, October 7 - 1 1, 1974, is comprised of the invited and contributed papers given at the Symposium. The objective of the Symposium was to define the present status of accuracy and the means of obtaining accuracy in trace analytical chemistry.

Over the past several years there has been an explosion in the number of chemical analyses performed, especially in the areas of environmental quality, plant and animal tissue analyses, biological fluids, high purity materials and geological samples. Because the results of these analyses are used in making important projections and decisions both short and long-term, it is essential that they be reliable. The various factors which contribute to obtaining accurate analytical results were explored in the Symposium. Particular emphasis was placed on the whole analysis, from taking the sample through the interpretation of the results, rather than concentrating on measurement processes only. The Symposium consisted of four and one-half days of papers. Leading authorities, with broad knowledge of the problems in the areas discussed, were invited to present the keynote lectures. Simultaneous sessions consisting of groups of papers corresponding roughly with the themes of the invited papers were presented in the afternoons.

It is hoped that this volume will provide much of the necessary background information and directions for the future to assist in establish ing priority goals and a rationale for solving the difficult problems in accu racy ln trace analysis in the next several years.

Identification of commercial materials and/ or equipment by the authors in these proceedings in no way implies recommendation or endorsement by the National Bureau of Standards.

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