Advanced Materials for Radiation Detection

Krzysztof (Kris) Iniewski

ISBN 10: 303076463X / ISBN 13: 9783030764630

Editore: Springer International Publishing, 2022

Riguardo questo articolo

Druck auf Anfrage Neuware - Printed after ordering - This book offers readers an overview of some of the most recent advances in the field of advanced materials used for gamma and X-ray imaging. Coverage includes both technology and applications, with an in-depth review of the research topics from leading specialists in the field. Emphasis is on high-Z materials like CdTe, CZT and GaAs, as well as perovskite crystals, since they offer the best implementation possibilities for direct conversion X-ray detectors. Authors discuss material challenges, detector operation physics and technology and readout integrated circuits required to detect signals processes by high-Z sensors.

Codice articolo 9783030764630

Dati bibliografici

• Titolo: Advanced Materials for Radiation Detection
• Editore: Springer International Publishing
• Data di pubblicazione: 2022
• Lingua: Inglese
• ISBN 10: 303076463X
• ISBN 13: 9783030764630
• Rilegatura: Taschenbuch
• Condizione: Neu
• Dimensioni: 235 L x 155 A x 20 P (millimetri) 235 millimetri di larghezza per 155 millimetri di altezza per 20 millimetri di profondità
• Peso: 552 grammi

Descrizione articolo

Riassunto

This book offers readers an overview of some of the most recent advances in the field of advanced materials used for gamma and X-ray imaging. Coverage includes both technology and applications, with an in-depth review of the research topics from leading specialists in the field. Emphasis is on high-Z materials like CdTe, CZT and GaAs, as well as perovskite crystals, since they offer the best implementation possibilities for direct conversion X-ray detectors.  Authors discuss material challenges, detector operation physics and technology and readout integrated circuits required to detect signals processes by high-Z sensors.

Informazioni sull?autore

Krzysztof (Kris) Iniewski is managing R&D development activities at Redlen Technologies Inc., a detector company based in British Columbia, Canada. During his 15 years at Redlen he has managed development of highly integrated CZT detector products in medical imaging and security applications. Prior to Redlen Kris hold various management and academic positions at PMC-Sierra, University of Alberta, SFU, UBC and University of Toronto. 

Dr. Iniewski has published over 150+ research papers in international journals and conferences. He holds 20+ international patents granted in USA, Canada, France, Germany, and Japan. He wrote and edited several books for Wiley, Cambridge University Press, Mc-Graw Hill, CRC Press and Springer. He is a frequent invited speaker and has consulted for multiple organizations internationally.