Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers

Yavor, Mikhail (Editor)/ Hawkes, Peter W. (Editor)

ISBN 10: 0123747686 / ISBN 13: 9780123747686

Editore: Academic Pr, 2009

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1st edition. 381 pages. 9.50x6.25x1.00 inches. In Stock.

Codice articolo __0123747686

Dati bibliografici

• Titolo: Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers
• Editore: Academic Pr
• Data di pubblicazione: 2009
• Lingua: Inglese
• ISBN 10: 0123747686
• ISBN 13: 9780123747686
• Rilegatura: Hardcover
• Condizione: Brand New

Descrizione articolo

Riassunto

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

* Contributions from leading international scholars and industry experts
* Discusses hot topic areas and presents current and future research trends
* Invaluable reference and guide for physicists, engineers and mathematicians

Informazioni sull?autore

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.