Analysis and Evaluation of Sampled Imaging Systems (Tutorial Texts in Optical Engineering)

Richard H. Vollmerhausen; Donald A. Reago; Ronald G. Driggers

ISBN 10: 0819480770 / ISBN 13: 9780819480774

Editore: SPIE--The International Society for Optical Engineering (edition Pap/Cdr), 2010

The item might be beaten up but readable. May contain markings or highlighting, as well as stains, bent corners, or any other major defect, but the text is not obscured in any way. Codice articolo 0819480770-7-1-13

Riassunto:

Advancing technology in detector arrays, flat panel displays, and digital image processing provides new opportunities to expand imaging applications and enhance system performance. Technical managers and design engineers are faced with evaluating the cost, weight, and performance of an ever-expanding selection of technology options. This tutorial text provides the theory, procedures, and information necessary to evaluate and compare the performance of available imaging technologies. Part I updates the earlier work presented in Analysis of Sampled Imaging Systems (2000). Part II discusses performance evaluation of electro-optical imagers. Part III provides computer programs (on a supplemental CD-ROM) and up-to-date information on detector arrays, optics, and display options. The book covers a variety of display formats and interfaces, and provides detailed information on available focal plane arrays (FPAs). Particular emphasis is placed on theory and practice for the wide variety of available infrared FPAs. Technologies represented include InSb, HgCdTe, QWIP, and uncooled thermal arrays. Information is provided on the quantum efficiency, blur, crosstalk, and noise characteristics of each technology. The detector and array dimensions of available FPAs are provided. The information on optics, display, and FPA subassemblies allows the model user to make quick and realistic performance assessments of electro-optical imager designs.

Dati bibliografici

Titolo: Analysis and Evaluation of Sampled Imaging ...
Casa editrice: SPIE--The International Society for Optical Engineering (edition Pap/Cdr)
Data di pubblicazione: 2010
Legatura: Paperback
Condizione: Fair
Edizione: Pap/Cdr.