WILEY-INTERSCIENCE PAPERBACK SERIES The Wiley-Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation. With these new unabridged softcover volumes, Wiley hopes to extend the lives of these works by making them available to future generations of statisticians, mathematicians, and scientists.
"Many examples drawn from the author’s experience of engineering applications are used to illustrate the theoretical results, which are presented in a cookbook fashion...it provides an excellent practical guide to the analysis of product-life data."
–T.M.M. Farley
Special Programme of Research in Human Reproduction
World Health Organization
Geneva, Switzerland
Review in Biometrics, September 1983
Now a classic, Applied Life Data Analysis has been widely used by thousands of engineers and industrial statisticians to obtain information from life data on consumer, industrial, and military products. Organized to serve practitioners, this book starts with basic models and simple informative probability plots of life data. Then it progresses through advanced analytical methods, including maximum likelihood fitting of advanced models to life data. All data analysis methods are illustrated with numerous clients' applications from the author's consulting experience
About the author: Wayne Nelson is a consulting statistician with the General Electric Company. He also consults on and teaches engineering and scientific applications of statistical methods for other companies throughout the country. In 1981 he received General Electric?s Dushman Award in recognition of his outstanding contributions to research and applications in product life data analysis and accelerated testing. Dr. Nelson is an Adjunct Professor at Union College and Rensselaer Polytechnic Institute, where he teaches graduate courses on the theory and application of statistics. A widely published author on statistical methods for engineering problems, he is also a Fellow of the American Statistical Association, and a member of the American Society for Quality Control, the Institute of Electrical and Electronics Engineers, and the Biometrics Society. Dr. Nelson received his Ph.D. in statistics from the University of Illinois in 1965.