Applied Scanning Probe Methods VI | Characterization

Bharat Bhushan (u. a.)

ISBN 10: 3540373187 / ISBN 13: 9783540373186

Editore: Springer, 2006

Applied Scanning Probe Methods VI | Characterization | Bharat Bhushan (u. a.) | Buch | NanoScience and Technology | xlv | Englisch | 2006 | Springer | EAN 9783540373186 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand. Codice articolo 112012202

Riassunto:

The first volume in the series was released in January 2004 and the second to fourth volumes in early 2006. The field is now progressing so fast that there is a need for one volume every 12 to 18 months to capture latest developments.

Volume VI presents 10 chapters on a variety of new and emerging techniques and refinements of SPM applications.

Contenuti: Scanning Tunneling Microscopy of Physisorbed Monolayers: From Self-Assembly to Molecular Devices.- Tunneling Electron Spectroscopy Towards Chemical Analysis of Single Molecules.- STM Studies on Molecular Assembly at Solid/Liquid Interfaces.- Single-Molecule Studies on Cells and Membranes Using the Atomic Force Microscope.- Atomic Force Microscopy of DNA Structure and Interactions.- Direct Detection of Ligand-Protein Interaction Using AFM.- Dynamic Force Microscopy for Molecular-Scale Investigations of Organic Materials in Various Environments.- Noncontact Atomic Force Microscopy.- Tip-Enhanced Spectroscopy for Nano Investigation of Molecular Vibrations.- Investigating Individual Carbon Nanotube/Polymer Interfaces with Scanning Probe Microscopy.

Dati bibliografici

Titolo: Applied Scanning Probe Methods VI | ...
Casa editrice: Springer
Data di pubblicazione: 2006
Legatura: Buch
Condizione: Neu