Best of Iccad : 20 Years of Excellence in Computer-Aided Design

IEEE/ACM International Conference on Computer-Aided Design; Kuehlmann, Andreas (EDT)

ISBN 10: 1402073917 / ISBN 13: 9781402073915

Editore: Springer, 2003

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Dati bibliografici

• Titolo: Best of Iccad : 20 Years of Excellence in Computer-Aided Design
• Editore: Springer
• Data di pubblicazione: 2003
• Lingua: Inglese
• ISBN 10: 1402073917
• ISBN 13: 9781402073915
• Rilegatura: Rilegato
• Condizione: As New

Descrizione articolo

Riassunto

In 2002, the International Conference on Computer Aided Design (ICCAD) celebrates its 20th anniversary. This book commemorates contributions made by ICCAD to the broad field of design automation during that time. The foundation of ICCAD in 1982 coincided with the growth of Large Scale Integration. The sharply increased functionality of board-level circuits led to a major demand for more powerful Electronic Design Automation (EDA) tools. At the same time, LSI grew quickly and advanced circuit integration became widely avail­ able. This, in turn, required new tools, using sophisticated modeling, analysis and optimization algorithms in order to manage the evermore complex design processes. Not surprisingly, during the same period, a number of start-up com­ panies began to commercialize EDA solutions, complementing various existing in-house efforts. The overall increased interest in Design Automation (DA) re­ quired a new forum for the emerging community of EDA professionals; one which would be focused on the publication of high-quality research results and provide a structure for the exchange of ideas on a broad scale. Many of the original ICCAD volunteers were also members of CANDE (Computer-Aided Network Design), a workshop of the IEEE Circuits and Sys­ tem Society. In fact, it was at a CANDE workshop that Bill McCalla suggested the creation of a conference for the EDA professional. (Bill later developed the name).

Contenuti

Foreword. Preface. - Part I: Functional Verification. Formal Methods for Functional Verification; R.E. Bryant, J.H. Kukula. Automating the Diagnosis and the Rectification of Design Errors with PRIAM; J.C. Madre, et al. Functional Comparison of Logic Designs for VLSI Circuits; C.L. Berman, L.H. Trevillyan. A Unified Framework for the Formal Verification of Sequential Circuits; O. Coudert, J.C. Madre. Dynamic Variable Ordering for Ordered Binary Decision Programs; R. Rudell. - Part II: System Design and Analysis. System Design and Analysis Overview; H. de Man, J. Rabaey. An Efficient Microcode Compiler for Custom DSP-Processors; G. Goossens, et al. HYPER-LP: A System for Power Minimization Using Architectural Transformations; A.P. Chandrakasan, et al. Power Analysis of Embedded Software: First Step towards Software Power Minimization; V. Tiwari, et al. A Methodology for Correct-by-Construction Latency Insensitive Design; L.P. Carloni, et al. - Part III: Logic Synthesis. Logic Synthesis Overview; R.K. Brayton, J.A. Darringer. Multiple-Level Logic Optimization System; R. Brayton, et al. Exact Minimization of Multi-Valued Functions for PLA Optimization; R. Rudell, A. Sangiovanni-Vincentelli. Improved Logic Optimization Using Global-Flow Analysis; C.L. Berman, L.H. Trevillyan. A Method for Concurrent Decomposition and Factorization of Boolean Expressions; J. Vasudevamurthy, J. Rajski. - Part IV: Analog and Digital Circuit Design. Highlights in Analog and Digital Circuit Design and Synthesis at ICCAD; R. Harjani, et al. An Interactive Device Characterization and Model Development System; E. Khalily, et al. TILOS: A Posynomial Programming Approach to Transistor Sizing; J.P. Fishburn, A.E. Dunlop. SPECS2: An Integrated Circuit Timing Simulator; C. Visweswariah, et al. Automatic Synthesis of Operational Amplifiers based on Analytic Circuit Models; Han Young Koh, et al. - Part V: Physical Simulation and Analysis. Highlights in Physical Simulation and Analysis at ICCAD; K.S. Kundert, J. White. Nonlinear Simulation in the Frequency Domain; K.S. Kundert, A. Sangiovanni-Vincentelli. Modeling the Driving-Point Characteristic of Resistive Interconnect for Accurate Delay Estimation; P.R. O'Brien, T.L. Savarino. Efficient Techniques for Inductance Extraction of Complex 3-D Geometries; M. Kamon, et al. Time-Domain Non-Monte Carlo Noise Simulation for Nonlinear Dynamic Circuits with Arbitrary Excitations; A. Demir, et al. - Part VI: Physical Design. Physical Design Overview; E.S. Kuh, Chi-Ping Hsu. Floorplan Design Using Annealing; R.H.J.M. Otten, L.P.P.P.van Ginneken. GOALIE: A Space-Efficient System for VLSI Artwork Analysis; T.G. Szymanski, C.J.van Wyk. Gordian: A New Global Optimization/ Rectangle Dissection Method for Cell Placement; J.M. Kleinhans, et al. Exact Zero Skew; Ren-Tsong Tsay. - Part VII: Timing, Test and Manufacturing. Timing, Test and Manufacturing Overview; K.A. Sakallah, et al. A Methodology for Worst Case Design of Integrated Circuits; A.J. Strojwas, et al. Timing Analysis using Functional Relationships; D. Brand, V.S. Iyengar. On the Design of Robust Multiple Fault Testable CMOS Combinational Logic Circuits; S. Kundu, et al. Circuit Optimization Driven by Worst-Case Differences; K.J. Antreich, H.E. Graeb. - Part VIII: Industry Viewpoints. A Cadence Perspective on ICCAD; L.K. Scheffe