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Paperback. This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included. This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. This item is printed on demand. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability. Codice articolo 9780521031707
A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors.
Recensione: '... a useful and nearly comprehensive guide to current work in the subject.' J. P. Davey, Contemporary Physics
Titolo: Characterization of High Tc Materials and ...
Casa editrice: Cambridge University Press, Cambridge
Data di pubblicazione: 2006
Legatura: Paperback
Condizione: new
Da: GreatBookPrices, Columbia, MD, U.S.A.
Condizione: New. Codice articolo 4891545-n
Quantità: Più di 20 disponibili
Da: BargainBookStores, Grand Rapids, MI, U.S.A.
Paperback or Softback. Condizione: New. Characterization of High Tc Materials and Devices by Electron Microscopy. Book. Codice articolo BBS-9780521031707
Quantità: 5 disponibili
Da: Chiron Media, Wallingford, Regno Unito
Paperback. Condizione: New. Codice articolo 6666-IUK-9780521031707
Quantità: Più di 20 disponibili
Da: GreatBookPricesUK, Woodford Green, Regno Unito
Condizione: New. Codice articolo 4891545-n
Quantità: Più di 20 disponibili
Da: Ria Christie Collections, Uxbridge, Regno Unito
Condizione: New. In. Codice articolo ria9780521031707_new
Quantità: Più di 20 disponibili
Da: California Books, Miami, FL, U.S.A.
Condizione: New. Codice articolo I-9780521031707
Quantità: Più di 20 disponibili
Da: Revaluation Books, Exeter, Regno Unito
Paperback. Condizione: Brand New. 406 pages. 9.30x6.70x1.00 inches. In Stock. This item is printed on demand. Codice articolo __0521031702
Quantità: 1 disponibili
Da: GreatBookPrices, Columbia, MD, U.S.A.
Condizione: As New. Unread book in perfect condition. Codice articolo 4891545
Quantità: Più di 20 disponibili
Da: moluna, Greven, Germania
Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning . Codice articolo 446922162
Quantità: Più di 20 disponibili
Da: THE SAINT BOOKSTORE, Southport, Regno Unito
Paperback / softback. Condizione: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days. Codice articolo C9780521031707
Quantità: Più di 20 disponibili