Controlled Atmosphere Transmission Electron Microscopy

Lingua: inglese

Editore: Springer International Publishing Mrz 2019, 2019

331979440X / 9783319794402

Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.

Venditore con 5 stelle

Venditore AbeBooks dal 11 gennaio 2012

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Descrizione dell’articolo da parte del venditore

This item is printed on demand - it takes 3-4 days longer - Neuware -This book illustrates the practical workings of environmental transmission electron microscopy (ETEM) from history and instrument design through to solving practical problems. Aspects of instrument design, performance, and operating procedures are covered, together with common problems and pitfalls of the technique. Not only will a properly operated instrument and a carefully set up experiment provide new insight into your specimen, but the ability to observe the specimen in its natural habitat will be essential to meeting specific design criteria for the development of the next generation of materials.Over the past five decades, transmission electron microscopy (TEM) under environmental conditions relevant to a particular sample has been of increasing interest. Symposia dealing with the topic are now among the best attended at international microscopy conferences. Since typical operating modes for the ETEM require the sample be subjected to a harsh environment consisting of corrosive gases and hightemperatures, the challenges of adapting and operating the instrument for observation under dynamic operating conditions are numerous. However, careful consideration of the interaction of the electrons with the gases and sample, as well as the gases with the microscope components, can lead to highly rewarding results. In Controlled Atmosphere Transmission Electron Microscopy, leading experts help you to perform successful experiments using the ETEM, and to interpret and understand the results. 340 pp. Englisch.…

Codice articolo 9783319794402

Titolo
Controlled Atmosphere Transmission Electron Microscopy
Autore
Jakob Birkedal Wagner
Editore
Springer International Publishing Mrz 2019
Anno di pubblicazione
2019
Condizione
Neu
Rilegatura
Taschenbuch
Lingua
inglese
ISBN 10
331979440X
ISBN 13
9783319794402
Peso dell'articolo
517 grammi
Dimensioni
235x155x19 mm

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germania

Venditore con 5 stelle

Venditore AbeBooks dal 11 gennaio 2012

Tariffe di spedizione da Germania a U.S.A.

ArticoloDa 5 a 15 giorni lavorativiDa 5 a 15 giorni lavorativi
Primo articoloEUR 23,00EUR 23,00
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BuchWeltWeit Ludwig Meier e.K.

Germania

BuchWeltWeit Inh. Ludwig Meier e.K.
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