The Core Test Wrapper Handbook : Rationale and Application of IEEE Std. 1500(TM)

Lingua: inglese

Editore: Springer, 2014

148998769X / 9781489987693

Serie: Libro 14 di 40 - Frontiers in Electronic Testing

Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH

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Druck auf Anfrage Neuware - Printed after ordering - In the early to mid-1990's while working at what was then Motorola Se- conductor, business changes forced my multi-hundred dollar microprocessor to become a tens-of-dollars embedded core. I ran into first hand the problem of trying to deliver what used to be a whole chip with something on the order of over 400 interconnect signals to a design team that was going to stuff it into a package with less than 220 signal pins and surround it with other logic. I also ran into the problem of delivering microprocessor specification verifi- tion - a microprocessor is not just about the functions and instructions included with the instruction set, but also the MIPs rating at some given f- quency. I faced two dilemmas: one, I could not deliver functional vectors without significant development of off-core logic to deal with the reduced chip I/O map (and everybody's I/O map was going to be a little different); and two, the JTAG (1149. 1) boundary scan ring that was around my core when it was a chip was going to be woefully inadequate since it did not support - speed signal application and capture and independent use separate from my core. I considered the problem at length and came up with my own solution that was predominantly a separate non-JTAG scan test wrapper that supported at-speed application of launch-capture cycles using the system clock. But my problems weren't over at that point either.

Codice articolo 9781489987693

Titolo
The Core Test Wrapper Handbook : Rationale and Application of IEEE Std. 1500(TM)
Autore
Tom Waayers
Editore
Springer
Anno di pubblicazione
2014
Condizione
Neu
Rilegatura
Taschenbuch
Lingua
inglese
ISBN 10
148998769X
ISBN 13
9781489987693
Peso dell'articolo
470 grammi
Dimensioni
235x155x17 mm
Serie
Libro 14 di 40: Frontiers in Electronic Testing

AHA-BUCH GmbH

Einbeck, Germania

Venditore con 5 stelle

Venditore AbeBooks dal 14 agosto 2006

Tariffe di spedizione da Germania a U.S.A.

ArticoloDa 5 a 7 giorni lavorativiDa 7 a 10 giorni lavorativi
Primo articoloEUR 30,50EUR 30,50
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