The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500™ (Frontiers in Electronic Testing, 35)

da Silva, Francisco; McLaurin, Teresa; Waayers, Tom

ISBN 10: 0387307516 / ISBN 13: 9780387307510

Editore: Springer, 2006

Riguardo questo articolo

Codice articolo Shelfdream0387307516

Dati bibliografici

• Titolo: The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500™ (Frontiers in Electronic Testing, 35)
• Editore: Springer
• Data di pubblicazione: 2006
• Lingua: Inglese
• ISBN 10: 0387307516
• ISBN 13: 9780387307510
• Rilegatura: hardcover
• Condizione: 11

Descrizione articolo

Riassunto

I ran into first hand the problem of trying to deliver what used to be a whole chip with something on the order of over 400 interconnect signals to a design team that was going to stuff it into a package with less than 220 signal pins and surround it with other logic.

Dalla quarta di copertina

The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500^TM

provides insight into the rules and recommendations of IEEE Std. 1500. The authors present background information about some of the choices and decisions made throughout the

design of this IEEE standard conceived to enable efficient core test reuse and debug at the

SOC level.

The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500^TM focuses on practical design considerations and design choices inherent to the application of IEEE Std. 1500. This book teaches an engineer how to add a 1500 wrapper to their core in easy to understand steps. Starting with a bare core (a core without 1500 wrapper), the book progressively builds a 1500 compliant wrapper around this core while discussing overall requirements for each portion of the 1500 wrapper. The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500^TM is a very valuable reference for professionals and researchers in the areas of design for test, design for test reuse/design reuse, and SOC implementation.