Cross-Talk Noise Immune VLSI Design Using Regular Layout Fabrics

Lingua: inglese

Editore: Springer US Jun 2001, 2001

079237407X / 9780792374077

Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.

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Venditore AbeBooks dal 11 gennaio 2012

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Descrizione dell’articolo da parte del venditore

This item is printed on demand - it takes 3-4 days longer - Neuware -This book was motivated by the problems being faced with shrinking IC process feature sizes. It is well known that as process feature sizes shrink, a host of electrical problems like cross-talk, electromigration, self-heat, etc. are becoming important. Cross-talk is one of the major problems since it results in unpredictable design behavior. In particular, it can result in significant delay variation or signal integrity problems in a wire, depending on the state of its neighboring wires. Typical approaches to tackle the cross-talk problem attempt to fix the problem once it is created. In our approach, we ensure that cross-talk is eliminated by design. The work described in this book attempts to take an 'outside-the-box' view and propose a radically different design style. This design style first imposes a fixed layout pattern (or fabric) on the integrated circuit, and then embeds the circuit being implemented into this fabric. The fabric is chosen carefully in order to eliminate the cross-talk problem being faced in modem IC processes. With our choice of fabric, cross-talk between adjacent wires on an IC is reduced by between one and two orders of magnitude. In this way, the fabric concept eliminates cross-talk up-front, and by design. We propose two separate design flows, each of which uses the fabric concept to implement logic. The first flow uses fabric-compliant standard cells as an im plementation vehicle. We call these cells fabric cells, and they have the same logic functionality as existing standard cells with which they are compared. 140 pp. Englisch.…

Codice articolo 9780792374077

Titolo
Cross-Talk Noise Immune VLSI Design Using Regular Layout Fabrics
Autore
Alberto L. Sangiovanni-Vincentelli
Editore
Springer US Jun 2001
Anno di pubblicazione
2001
Condizione
Neu
Rilegatura
Buch
Lingua
inglese
ISBN 10
079237407X
ISBN 13
9780792374077
Peso dell'articolo
383 grammi
Dimensioni
241x160x13 mm

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germania

Venditore con 5 stelle

Venditore AbeBooks dal 11 gennaio 2012

Tariffe di spedizione da Germania a U.S.A.

ArticoloDa 5 a 15 giorni lavorativiDa 5 a 15 giorni lavorativi
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BuchWeltWeit Ludwig Meier e.K.

Germania