This book introduces big data analytics and corresponding applications in smart grids. The characterizations of big data, smart grids as well as a huge amount of data collection are first discussed as a prelude to illustrating the motivation and potential advantages of implementing advanced data analytics in smart grids.
Dr. D. K. Sharma is a Professor and Dean of SRM Institute of Science and Technology, Delhi-NCR Campus, Ghaziabad. He received his B.E degree in Electronics Engineering from MNNIT Allahabad, M.E degree from IIT Roorkee, and Ph.D degree from NIT Kurukshetra, India. He served Public Sector Undertakings in different positions in Quality Assurance & Testing and R & D departments. He has rich experience of more than 30 years in academia and industry. He has authored several research articles in international journals and conference proceedings and has been the editor of international conference proceedings and books. He has participated in many international and national conferences as session chair and member in steering, advisory and international program committees. His research interests include VLSI interconnects, QCA based circuits, Digital design, and Signal processing. He is Life member of ISTE, Life member of IETE and Senior Member of IEEE.
Dr. Rohit Sharma is currently an Associate Professor in the Department of Electronics and Communication Engineering, SRM Institute of Science and Technology, Delhi NCR Campus Ghaziabad, India. He is an active member of ISTE, IEEE, ICS, IAENG, and IACSIT. He is an editorial board member and reviewer of more than 12 international journals and conferences, including the topmost journal IEEE Access and IEEE Internet of Things Journal. He serves as a Book Editor for 23 different titles to be published by CRC Press, Taylor & Francis Group, USA and Apple Academic Press, CRC Press, Taylor & Francis Group, USA, Springer, etc. He received the Young Researcher Award in "2nd Global Outreach Research and Education Summit & Awards 2019" hosted by Global Outreach Research & Education Association (GOREA). He is serving as Guest Editor in various SCIE indexed journals of Elsevier, CEE, IET Communications Willey, Expert Systems Wiley etc. He has activelybeen an organizing end of various reputed International conferences.
Prof. Gwanggil Jeon received the B.S., M.S., and Ph.D. (summa cum laude) degrees from the Department of Electronics and Computer Engineering, Hanyang University, Seoul, Korea, in 2003, 2005, and 2008, respectively. From 2009.09 to 2011.08, he was with the School of Information Technology and Engineering, University of Ottawa, Ottawa, ON, Canada, as a post-doctoral fellow. From 2011.09 to 2012.02, he was with the Graduate School of Science and Technology, Niigata University, Niigata, Japan, as an assistant professor. From 2014.12 to 2015.02 and 2015.06 to 2015.07, he was a visiting scholar at Centre de Mathématiques et Leurs Applications (CMLA), École Normale Supérieure Paris-Saclay (ENS-Cachan), France. From 2019 to 2020, he was a prestigious visiting professor at Dipartimento di Informatica, Università degli Studi di Milano Statale, Italy. He is currently a full professor at Incheon National University, Incheon, Korea.
Dr. Raghvendra Kumar is working as Associate Professor in Computer Science and Engineering Department at G.I.E.T University Odisha, India, and Serving as Director of IT and Data Science Department, Vietnam Center of Research in Economics, Management, Environment (VCREME) - Branch VCREME One Member Company Limited, Vietnam. He received B. Tech. in Computer Science and Engineering from SRM University Chennai (Tamil Nadu), India, M. Tech. in Computer Science and Engineering from KIIT University, Bhubaneswar, (Odisha) India and Ph.D. in Computer Science and Engineering from Jodhpur National University, Jodhpur (Rajasthan), India. He serves as Series Editor Internet of Everything (IOE): Security and Privacy Paradigm publishes by CRC press, Taylor & Francis Group, USA and Bio-Medical Engineering: Techniques and Applications, Publishes by Apple Academic Press, CRC Press, Taylor & Francis Group, USA.
