Defects - Recognition, Imaing and Physics in Semiconductors 1999. Proceedings of the Eighth International Conference.

Ogawa, T. and M. Tajima (editors)

Editore: Elsevier Scientific Publishing Co, Amsterdam; (2000)

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Quarto. 420, (VIII)pp. Collected papers of the meeting on semiconductor researches. Each paper has reference, figures, photographs. Laid-in 8-page Author Index. Bound in pale blue and white cloth, lettering in black, spine lettering in white and black. A fine copy.

Codice articolo 010904

Dati bibliografici

• Titolo: Defects - Recognition, Imaing and Physics in Semiconductors 1999. Proceedings of the Eighth International Conference.
• Editore: Elsevier Scientific Publishing Co, Amsterdam; (2000)
• Cataloghi dei venditori:
  • Science and Technology