Delay Fault Testing for VLSI Circuits

Lingua: inglese

Editore: Springer US Okt 1998, 1998

0792382951 / 9780792382959

Serie: Libro 31 di 40 - Frontiers in Electronic Testing

Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.

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This item is printed on demand - it takes 3-4 days longer - Neuware -In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, the circuit would function correctly. With improvements in the semiconductor process technology, our expectations on speed have soared. A frequently asked question in the last decade has been how fast can the clock run. This puts significant demands on timing analysis and delay testing. Fueled by the above events, a tremendous growth has occurred in the research on delay testing. Recent work includes fault models, algorithms for test generation and fault simulation, and methods for design and synthesis for testability. The authors of this book, Angela Krstic and Tim Cheng, have personally contributed to this research. Now they do an even greater service to the profession by collecting the work of a large number of researchers. In addition to expounding such a great deal of information, they have delivered it with utmost clarity. To further the reader's understanding many key concepts are illustrated by simple examples. The basic ideas of delay testing have reached a level of maturity that makes them suitable for practice. In that sense, this book is the best x DELAY FAULT TESTING FOR VLSI CIRCUITS available guide for an engineer designing or testing VLSI systems. Tech niques for path delay testing and for use of slower test equipment to test high-speed circuits are of particular interest. 212 pp. Englisch.

Codice articolo 9780792382959

Titolo
Delay Fault Testing for VLSI Circuits
Autore
Kwang-Ting (Tim) Cheng
Editore
Springer US Okt 1998
Anno di pubblicazione
1998
Condizione
Neu
Rilegatura
Buch
Lingua
inglese
ISBN 10
0792382951
ISBN 13
9780792382959
Peso dell'articolo
489 grammi
Dimensioni
241x160x17 mm
Serie
Libro 31 di 40: Frontiers in Electronic Testing

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germania

Venditore con 5 stelle

Venditore AbeBooks dal 11 gennaio 2012

Tariffe di spedizione da Germania a U.S.A.

ArticoloDa 5 a 15 giorni lavorativiDa 5 a 15 giorni lavorativi
Primo articoloEUR 23,00EUR 23,00
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BuchWeltWeit Ludwig Meier e.K.

Germania