Design-for-Test for Digital IC's and Embedded Core Systems

Crouch, Alfred

ISBN 10: 0130848271 / ISBN 13: 9780130848277

Editore: Pearson Education, Limited, 1999

Riguardo questo articolo

Used book that is in clean, average condition without any missing pages. Codice articolo 11013114-20

Dati bibliografici

Titolo: Design-for-Test for Digital IC's and ...

Casa editrice: Pearson Education, Limited

Data di pubblicazione: 1999

Legatura: Brossura

Condizione: Good

Descrizione articolo

Riassunto:

The purpose of this book is to introduce the basic concepts of test and design-for-test (DFT), and to then address the application of these concepts with an eye toward the trade-offs of the engineering budgets (area, frequency, power, etc.), the business drivers, and the cost drivers. This practical guide on the test and Design-for-test topics has been developed along the lines of a just what you need to know and how to do it guide that explains the topic, the trade-offs, and relates the topic to the design flow.

Informazioni sull?autore:

AL CROUCH began his testing career repairing meteorological equipment for the U.S. Air Force. He later earned BSEE and MSEE degrees from the University of Kentucky. He has worked for Texas Instruments, Digital Equipment Corporation, and Motorola, focusing on design-for-test, test automation, and computer aided testing. He has been issued nine U.S. Patents and is an experienced trainer and conference presenter.