Diffraction Analysis of the Microstructure of Materials Springer Series in Materials Science, 68

Mittemeijer, Eric J. and Paolo Scardi:

ISBN 10: 3540405194 / ISBN 13: 9783540405191

Editore: Springer, 2004

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549 Seiten Der Erhaltungszustand des hier angebotenen Werks ist trotz seiner Bibliotheksnutzung sehr sauber und kann entsprechende Merkmale aufweisen (Rückenschild, Instituts-Stempel.). In ENGLISCHER Sprache. Sprache: Englisch Gewicht in Gramm: 990.

Codice articolo 2156218

Dati bibliografici

• Titolo: Diffraction Analysis of the Microstructure of Materials Springer Series in Materials Science, 68
• Editore: Springer
• Data di pubblicazione: 2004
• Lingua: Inglese
• ISBN 10: 3540405194
• ISBN 13: 9783540405191
• Rilegatura: gebundene Ausgabe
• Condizione: Gut
• Peso: 990 grammi
• Cataloghi dei venditori:
  • 200 Mathematik

Descrizione articolo

Riassunto

Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.

Dalla quarta di copertina

Diffraction Analysis of the Microstructure of Materials provides an overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.