Digital Systems Testing and Testable Design

Abramovici, Miron; Breuer, Melvin A.; Friedman, Arthur D.

ISBN 10: 0780310624 / ISBN 13: 9780780310629

Editore: Wiley-IEEE Press, 1994

Riguardo questo articolo

May show signs of wear, highlighting, writing, and previous use. This item may be a former library book with typical markings. No guarantee on products that contain supplements Your satisfaction is 100% guaranteed. Twenty-five year bookseller with shipments to over fifty million happy customers. Codice articolo 36253-5

Dati bibliografici

Titolo: Digital Systems Testing and Testable Design

Casa editrice: Wiley-IEEE Press

Data di pubblicazione: 1994

Legatura: Rilegato

Condizione: good

Descrizione articolo

Riassunto:

This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.

L'autore:

Miron Abramovici is a Distinguished Member of the Technical Staff at AT&T Bell Laboratories in Murray Hill, and an Adjunct Professor of Computer Engineering at the Illinois Institute of Technology in Chicago.
Melvin A. Breuer is a Professor of Electrical Engineering and Computer Science at the University of Southern California in Los Angeles.
Arthur D. Friedman is a Professor in the Department of Electrical Engineering and Computer Science at George Washington University.

All three authors are Fellows of the IEEE and have contributed extensively to the fields discussed in this book.