Electrothermal Analysis of VLSI Systems

Yi-Kan Cheng

ISBN 10: 1475773730 / ISBN 13: 9781475773736

Editore: Springer-Verlag New York Inc., 2013

This item is printed on demand. New copy - Usually dispatched within 5-9 working days 370. Codice articolo C9781475773736

Riassunto:

Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems.
Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal/electrothermal simulation, and experimental setup-calibration).
Part II, The Applications, discusses three important applications of VLSI electrothermal analysis including temperature-dependent electromigration diagnosis, cell-level thermal placement and temperature-driven power and timing analysis.
Electrothermal Analysis of VLSI Systems will be useful for researchers in the fields of IC reliability analysis and physical design, as well as VLSI designers and graduate students.

Recensione: From the Foreword:

`Continuing increases in the levels of circuit integration and concomitant increases in performance are sustaining the trend of increasing power dissipation in VLSI systems. A consequence is that the impact of temperature on the successful operation and reliability of devices must be comprehended during the design process.....This text provides a comprehensive formulation of the electrothermal analysis problem beginning with a summary of the sources of power dissipation in CMOS circuits and followed by a formulation of the effect of temperature on MOS devices.'
Dr. Ralph K. Cavin, Vice President, Semiconductor Research Corporation

Dati bibliografici

Titolo: Electrothermal Analysis of VLSI Systems
Casa editrice: Springer-Verlag New York Inc.
Data di pubblicazione: 2013
Legatura: Paperback / softback
Condizione: New