Estimating Device Reliability:

Lingua: inglese

Editore: Springer US Nov 1992, 1992

079239304X / 9780792393047

Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.

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This item is printed on demand - it takes 3-4 days longer - Neuware -Estimating Device Reliability: Assessment of Credibility is concerned with the plausibility of reliability estimates obtained from statistical models. Statistical predictions are necessary because technology is always pushing into unexplored areas faster than devices can be made long-lived by design. Flawed reliability methodologies can produce disastrous results, an outstanding example of which is the catastrophic failure of the manned space shuttle CHALLENGER in January 1986. This issue is not whether, but which, statistical models should be used. The issue is not making reliability estimates, but is instead their credibility. The credibility questions explored in the context of practical applications include: What does the confidence level associated with the use of statistical model mean Is the numerical result associated with a high confidence level beyond dispute When is it appropriate to use the exponential (constant hazard rate) model Does this model always provide the most conservative reliability estimate Are the results of traditional `random' failure hazard rate calculations tenable Are there persuasive alternatives What model should be used to describe the useful life of a device when wearout is absent When Weibull and lognormal failure plots containing a large number of failure times appear similar, how should the correct wearout model be selected Is it important to distinguish between a conservative upper bound on a probability of failure and a realistic estimate of the same probability Estimating Device Reliability: Assessment of Credibility is for those who are obliged to make reliability calculations with a paucity of somewhat corrupt data, by using inexact models, and by making physical assumptions which are impractical to verify. Illustrative examples deal with a variety of electronic devices, ICs and lasers. 234 pp. Englisch.…

Codice articolo 9780792393047

Titolo
Estimating Device Reliability:
Autore
Franklin R. Nash
Editore
Springer US Nov 1992
Anno di pubblicazione
1992
Condizione
Neu
Rilegatura
Buch
Lingua
inglese
ISBN 10
079239304X
ISBN 13
9780792393047
Peso dell'articolo
521 grammi
Dimensioni
241x160x19 mm

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germania

Venditore con 5 stelle

Venditore AbeBooks dal 11 gennaio 2012

Tariffe di spedizione da Germania a U.S.A.

ArticoloDa 5 a 15 giorni lavorativiDa 5 a 15 giorni lavorativi
Primo articoloEUR 23,00EUR 23,00
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BuchWeltWeit Ludwig Meier e.K.

Germania