Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists (Paperback)

Lingua: inglese

Editore: Taylor & Francis Ltd, London, 2025

1032246804 / 9781032246802

Serie: Libro 16 di 16 - Advances in Materials Science and Engineering

Da: Grand Eagle Retail, Bensenville, IL, U.S.A.Grand Eagle Retail

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Venditore AbeBooks dal 12 ottobre 2005

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Paperback. The structureproperty relationship is a key topic in materials science and engineering. To understand why a material displays certain behaviors, the first step is to resolve its crystal structure and reveal its structure characteristics. Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists equips readers with an in-depth understanding of using powder x-ray diffraction and transmission electron microscopy for the analysis of crystal structures.Introduces fundamentals of crystallographyCovers XRD of materials, including geometry and intensity of diffracted x-ray beams and experimental methodsDescribes TEM of materials and includes atomic scattering factors, electron diffraction, and diffraction and phase contrastsDiscusses applications of HRTEM in materials researchExplains concepts used in XRD and TEM lab trainingBased on the authors course lecture notes, this text guides materials science and engineering students with minimal reliance on advanced mathematics. It will also appeal to a broad spectrum of readers, including researchers and professionals working in the disciplines of materials science and engineering, applied physics, and chemical engineering. The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications. It is written as an introduction to the topic with minimal reliance on advanced mathematics. This item is printed on demand. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.

Codice articolo 9781032246802

Titolo
Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists (Paperback)
Autore
Dong ZhiLi
Editore
Taylor & Francis Ltd, London
Anno di pubblicazione
2025
Condizione
new
Rilegatura
Paperback
Lingua
inglese
ISBN 10
1032246804
ISBN 13
9781032246802
Serie
Libro 16 di 16: Advances in Materials Science and Engineering

Grand Eagle Retail

Bensenville, IL, U.S.A.

Venditore con 5 stelle

Venditore AbeBooks dal 12 ottobre 2005

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ArticoloDa 6 a 14 giorni lavorativiDa 6 a 16 giorni lavorativi
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