Fundamentals of Forensic Science. Questo articolo non è disponibile.Fundamentals of Forensic Science

Fundamentals of Forensic Science, Third Edition, provides current case studies that reflect the ways professional forensic scientists work, not how forensic academicians teach. The book includes the binding principles of forensic science, including the relationships between people, places, and things as demonstrated by transferred evidence, the context of those people, places, and things, and the meaningfulness of the physical evidence discovered, along with its value in the justice system.

Written by two of the leading experts in forensic science today, the book approaches the field from a truly unique and exciting perspective, giving readers a new understanding and appreciation for crime scenes as recent pieces of history, each with evidence that tells a story.

Dr. Max M. Houck is an internationally-recognized forensic expert with research interests in forensic science, education, and the forensic enterprise and its industries. He has worked in all aspects of forensic science, including at the FBI Laboratory. Dr. Houck has published widely in books and peer-reviewed journals. His anthropology and trace evidence casework includes the Branch Davidian Investigation, the September 11 attacks on the Pentagon, the D.B. Cooper case, the US Embassy bombings in Africa, and the West Memphis Three case, among hundreds of others. He served for six years as the Chair of the Forensic Science Educational Program Accreditation Commission (FEPAC). Dr. Houck is a Fellow of the Royal Society of Chemistry and a founding Co-Editor of the journal Forensic Science Policy and Management.

Jay Siegel, PhD is retired Director of the Forensic and Investigative Sciences Program and Chair of the Department of Chemistry and Chemical Biology at Indiana University Purdue University Indianapolis. He was Director of the Forensic Science Program at Michigan State University for 25 years from 1980-2004 until his retirement as Professor Emeritus. Dr. Siegel is a Distinguished Member of the American Academy of Forensic Sciences and was named as Distinguished Alumni Scholar by his alma mater, George Washington University in 2011. He is co-editor of Forensic Science Policy and Management: An International Journal. He was a member of the National Academy of Sciences Forensic Science Committee from 2006-09.