High Performance Memory Testing

R. Dean Adams

ISBN 10: 1402072554 / ISBN 13: 9781402072550

Editore: Springer US, Springer US Sep 2002, 2002

Riguardo questo articolo

This item is printed on demand - Print on Demand Titel. Neuware -Are memory applications more critical than they have been in the past Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 266 pp. Englisch.

Codice articolo 9781402072550

Dati bibliografici

• Titolo: High Performance Memory Testing
• Editore: Springer US, Springer US Sep 2002
• Data di pubblicazione: 2002
• Lingua: Inglese
• ISBN 10: 1402072554
• ISBN 13: 9781402072550
• Rilegatura: Buch
• Condizione: Neu
• Dimensioni: 241 L x 160 A x 19 P (millimetri) 241 millimetri di larghezza per 160 millimetri di altezza per 19 millimetri di profondità
• Peso: 568 grammi

Descrizione articolo

Riassunto

Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.

High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.

Recensione

From the reviews:

"Fulfilling a need in the industry and a need in the literature, the book is certain to stimulate a heightened research interest in memory test, memory design, and memory elf test, each of which by itself constitutes an intriguing subject. The observations and approaches of the book make it a most useful work for the professional and the researcher in helping them understand the memories that are being tested." (Current Engineering Practice, Vol. 47, 2002-2003)