High-Resolution X-Ray Scattering from Thin Films and Multilayers (Springer Tracts in Modern Physics)

Holy, Vaclav, Pietsch, Ullrich, Baumbach, Tilo

ISBN 10: 354062029X / ISBN 13: 9783540620297

Editore: Springer, 1998

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Codice articolo ERICA758354062029X5

Dati bibliografici

• Titolo: High-Resolution X-Ray Scattering from Thin Films and Multilayers (Springer Tracts in Modern Physics)
• Editore: Springer
• Data di pubblicazione: 1998
• Lingua: Inglese
• ISBN 10: 354062029X
• ISBN 13: 9783540620297
• Rilegatura: Hardcover
• Condizione: Like New
• Tipo di libro: book

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Riassunto

This critical overview presents experimental methods for solving most frequent structural problems of mono-crystalline thin films and layered systems, including thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is intended as a reference for experimentalists who want to improve their knowledge on modern X-ray methods for thin film analysis.

Dalla quarta di copertina

This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems:
thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis.