Hybrid Thin-Slot Algorithm for the Analysis of Narrow Apertures in Finite-Difference Time-Domain Calculations

Editore: Sandia National Laboratories, Albuquerque, NM, 1990

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Venditore AbeBooks dal 14 agosto 1998

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Descrizione dell’articolo da parte del venditore

Pagination is 18 pages and 12 pages of figures. List of Figures. Illustrations. Formulae. References. Appendix A and B. Printed single sided. Stapled at upper left corner. The authors were with the Radiation and Electromagnetic Analysis Division of Sandia National Laboratories in Albuquerque, New Mexico. We believe that this is the same Douglas Riley who wrote Finite Element Analysis of Antennas and Arrays. There is a notation at the top of the title page that this article was to appear in December, IEEE Trans. Ant. & Prop. [It did appear in IEEE Transactions on Antennas and Propagation ( Volume: 38 , Issue: 12 , Dec 1990).] First page is wrinkled with edge tears. A technique to incorporate a half-space aperture integral equation into a finite-difference time-domain (FDTD) code based on the offset Yee mesh (see K.S. Yee, ibid., vol. AP-14, p.302-7, 1966) is presented. To introduce the technique, linear apertures that are electrically narrow in both width and depth are discussed. The method incorporates an independent time-marching solution for the aperture problem into the FDTD code so that the aperture formally does not exist within the main FDTD mesh. A feedback scheme is introduced so that full exterior and interior coupling is included in the aperture solution. The technique is particularly useful for the analysis of apertures that are narrow both in width and depth with regard to the FDTD spatial cell. Previous thin-slot methods are shown to significantly underestimate the transverse gap electric field for this case, and an explanation for this is provided with the aid of the hybrid algorithm.…

Codice articolo 76492

Dati bibliografici

Titolo
Hybrid Thin-Slot Algorithm for the Analysis of Narrow Apertures in Finite-Difference Time-Domain Calculations
Autore
Riley, Douglas J., and Turner, C. David
Editore
Sandia National Laboratories, Albuquerque, NM
Anno di pubblicazione
1990
Condizione
Fair
Rilegatura
Wraps
Edizione
Reprint/Xerox type copy.

Ground Zero Books, Ltd.

Silver Spring, MD, U.S.A.

Venditore con 5 stelle

Venditore AbeBooks dal 14 agosto 1998

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