Interconnect Noise Optimization in Nanometer Technologies. Questo articolo non è disponibile.
Lingua: inglese
Editore: Springer, 2005
- Rilegato
- Nuovo

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Venditore AbeBooks dal 25 marzo 2015
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Descrizione dell’articolo da parte del venditore
In English.
Codice articolo ria9780387258706_new
- Titolo
- Interconnect Noise Optimization in Nanometer Technologies
- Autore
- Elgamel, Mohamed; Bayoumi, Magdy A.
- Editore
- Springer
- Anno di pubblicazione
- 2005
- Condizione
- New
- Rilegatura
- Rilegato
- Lingua
- inglese
- ISBN 10
- 0387258701
- ISBN 13
- 9780387258706
- Peso dell'articolo
- 525 grammi
Interconnect has become the dominating factor in determining system performance in nanometer technologies. Dedicated to this subject, Interconnect Noise Optimization in Nanometer Technologies provides insight and intuition into layout analysis and optimization for interconnect in high speed, high complexity integrated circuits.
The authors bring together a wealth of information presenting a range of CAD algorithms and techniques for synthesizing and optimizing interconnect. Practical aspects of the algorithms and the models are explained with sufficient details. The book investigates the most effective parameters in layout optimization. Different post-layout optimization techniques with complexity analysis and benchmarks tests are provided. The impact crosstalk noise and coupling on the wire delay is analyzed. Parameters that affect signal integrity are also considered.
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Dalla quarta di copertina
Interconnect has become the dominating factor in determining system performance in nanometer technologies. Dedicated to this subject, Interconnect Noise Optimization in Nanometer Technologies provides insight and intuition into layout analysis and optimization for interconnect in high speed, high complexity integrated circuits.
The authors bring together a wealth of information presenting a range of CAD algorithms and techniques for synthesizing and optimizing interconnect. Practical aspects of the algorithms and the models are explained with sufficient details. The book investigates the most effective parameters in layout optimization. Different post-layout optimization techniques with complexity analysis and benchmarks tests are provided. The impact crosstalk noise and coupling on the wire delay is analyzed. Parameters that affect signal integrity are also considered.
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